Release of JEM-F200, a Multi-purpose Transmission Electron Microscope

2016/01/04

JEOL Ltd. (President Gon-emon Kurihara) announced a new multi-purpose transmission electron microscope, JEM-F200, to be distributed in January 4, 2016.

Product development background

Field emission transmission electron microscopes with a maximum accelerating voltage of 200 kV have become a multi functional high resolution analytical tool, which is used in a wide range of applications from scientific research in academia to product development and quality control in the private sector.
Recently, these electron microscopes are increasingly versatile as they incorporate a full range of peripherals such as CMOS high speed digital cameras, various STEM detectors, high sensitivity EDS and EELS, and liquid and gas atmospheric imaging holders, as well as a host of new techniques such as EDS tomography, and precession electron diffraction.
However, the operation process can be lengthy or complicated if these peripherals are simply installed in the microscope. Simplifying the control views and switches on the operation panel for certain applications may sacrifice the effectiveness of other applications that require intricate imaging and analysis.
Meanwhile, some of these microscopes, incorporating multitudes of accessories, often look intimidating, especially for novices in the field of electron microscopy.
Furthermore, as the Paris Climate Conference (COP21) is attracting attention, those using electron microscopes as a sophisticated research tool are stepping up their effort in reducing carbon dioxide as well.
Under these circumstances, we have developed the JEM-F200, a new field emission transmission electron microscope, which features higher spatial resolution and analytical performance, an easy to use new operation system for multi purpose operation, a smart appearance, and various environmental friendly, energy saving system for CO2 reduction.

Main Features

  1. Smart design
    The JEM-F200 has a new, handsome appearance.
    It incorporates a new, intuitive user interface specifically designed for analytical electron microscopy.
    It also features outstanding mechanical and electrical stability, which reflects JEOL’s engineering expertise accumulated over the years.
  2. Quad-Lens condenser system
    Today’s electron microscopy is required to support a wide range of imaging techniques from bright field/dark field TEM to STEM that uses a variety of detectors. The JEM-F200, with its new 4-stageprobe-forming optical system, Quad-Lens condenser system, controls the electron beam intensity and the convergence angle independently to respond to different research requirements.
  3. Advanced Scan system
    The JEM-F200 incorporates a new scanning system, Advanced Scan system, which is capable of scanning the electron beam in the image forming system (optional) , in addition to the standard scanning system for the probe-forming system. This accomplishes wide field STEM-EELS.
  4. Pico Stage Drive
    The JEM-F200 uses a Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample grid to atomic order images.
  5. SPECPORTER (auto holder loading/unloading device)
    Loading/unloading of a specimen holder has been considered a difficult part of operation, especially for the beginners.
    The JEM-F200 incorporates a new device, SPECPORTER, to facilitate loading and unloading of the specimen holder.
    Placing a specimen holder at a given location, and activating the SPECPORTER by a single click insures safe loading and unloading of the holder.
  6. Improved cold FEG
    The JEM-F200 supports an optional cold field emission electron gun.
    Guaranteeing high stability, high brightness, and high energy resolution, the cold field emission electron gun enables chemical bonding analysis by EELS, speeds up the analytical process by the high brightness electron beam, and minimizes chromatic aberrations from the electron source for enabling high resolution imaging.
  7. Dual SDD
    The JEM-F200 simultaneously supports two units of an optional high sensitivity large silicon drift detectors (SDD).
    The SDD, featuring enhanced sensitivity, enables speedy EDS analysis while minimizing sample damage.
  8. Environmental friendly
    The JEM-F200 incorporates an energy saving system, the ECO mode, as standard for the first time in any transmission electron microscope. The ECO mode is designed to maintain the optimum conditions of the microscope at a minimum level of energy consumption when it is not in operation.
    The ECO mode can reduce the energy consumption to approximately 1/5 of the normal operation mode.
    Its scheduling function can restore the original conditions at any date specified.

Main Specifications

Resolution* TEM point to point: 0.19 nm
STEM-HAADF: 0.14 nm
Electron gun Schottky field emission gun or cold field emission electron gun
Maximum accelerating voltage 200 kV
Optional accessories Energy dispersive X-ray spectrometer (EDS),
electron energy loss spectrometer (EELS),
digital camera
* CF-UHR configuration

JEM-F200

Annual unit sales target

40 units/year

JEOL Ltd.
JEOL is a world leader in electron optical equipment and instrumentation for high-end scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs and ESRs.

For more information about JEOL Ltd. or any JEOL products, visit www.jeol.com.