70th Anniversary
Evolving in the 70th Year

In 2019, JEOL Ltd. celebrated its 70th anniversary since its founding.“Evolving in the 70th Year” is the new guideline that we should follow.

LIB Note
LIB Note

Morphology Observation & Surface Analysis Instruments
XRF/XPS/EPMA/AES/SEM/TEM/CP/FIB
Chemical Analysis Instruments
GC-MS / NMR
Fabrication Systems
Roll to Roll Electron Beam Deposition Systems
RF Induction Thermal Plasma System for Nano Particle Synthesis

Battery Note
BatteryNote

Lithium Ion Batteries
CP/XRF/SEM/AES/SXES/NMR/FIB/INFITOF/MS/XPS
Fuel Cells
TEM
Manufacturing Equipment
Nanopowder Synthesis Systems

JCM-7000 NeoScope™ Benchtop SEM
JCM-7000 NeoScope™

The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". The JCM-7000 incorporates three innovative functions; "Zeromag" for smooth transition from optical to SEM imaging, "Live Analysis” for finding constituent elements for an image observation area, and "Live 3D" for displaying a reconstructed live 3D image during SEM observation.

JIB-4000PLUS Focused Ion Beam Milling & Imaging System
JIB-4000PLUS

The JIB-4000PLUS is a focused ion beam milling & imaging system (single-beam FIB system) featuring a high-performance ion optical column. In addition, the JIB-4000PLUS can be equipped with a 3D observation function and an automatic TEM specimen preparation function; thus the system meets a variety of needs for specimen preparations.
APPLICATIONS
NOTE

JEOL, a world-leading high-end scientific instruments manufacture,
provides a wealth of applications and technical information.

NEWS

Glossary of TEM Terms
Event / Exhibition
xCLent IV

xCLent IV

xCLent IV is a fully integrated cathodoluminescence spectrometry system for JEOL electron microprobes.

 Introduction to JEOL Products

INTRODUCTION TO JEOL PRODUCTS

Welcome to the World of Science.

 OPEN INNOVATION

OPEN INNOVATION

By collaborating with universities and institutes, JEOL is promoting scientific research.

 KAZATO RESEARCH FOUNDATION

KAZATO RESEARCH FOUNDATION

For supporting young researhers using electoron microscopes.

ABOUT US

JEOL (AUSTRALASIA) PTY.LTD.

JEOL (AUSTRALASIA) PTY.LTD.

SALES & SERVICE

Suite 1, Level 2, 18 Aquatic Drive
Frenchs Forest NSW 2086
Australia
TEL: 02-9451-3855
FAX: 02-9451-3822
Email: info@jeol.com.au

Local Service Centres

Melbourne
Brisbane

JEOL Australasia Pty. Ltd. is a fully owned subsidiary of JEOL Ltd. We were established in 1965 and provide both sales and service support throughout Australia and New Zealand. JEOL has a vast wealth of expertise and knowledge in the scientific field with more than 60 years experience in the field of electron microscopy 50 year in mass spectrometry and nuclear magnetic resonance (NMR) and 40+ years experience in electron beam lithography.

JEOL Australasia Pty. Ltd. has a strong presence in the Australian market which is maintained through excellent customer service, this team consists of 6 service engineers, 4 of these are Sydney based with a further engineer in both Perth and Brisbane. Our sales and management team is based out of the JEOL head office in Sydney, Frenchs Forest.

JEOL Australasia has a strong belief in customer satisfaction and a commitment to provide the best customer service and support. To aid in this we have improved our level of ISO certification to 9001:2008 to provide a continuous commitment to our customers.