About Natural Lacquer: "Urushi Chemistry"
Features and Application Examples of Various Instrumental Analysis Methods:
Analysis of Urushiol Components: "Monomer Analysis"
Analysis of Natural Lacquer during Hardening: "Time-Course Analysis during Film Formation"
Comparison of Natural Lacquer Films Formed under Different Conditions: "Comparative Analysis"
Heat Resistance Assessment of a Natural Lacquer Film: "Thermal Degradation Analysis"
Detection of Polysaccharide (Plant Gum) : "Trace Components or Additives Analysis"
A New Atomic Resolution Electron Microscope has been released! The "GRAND ARM™" has been upgraded. This new "GRAND ARM™2" enables observation at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages.
JXA-iHP200F - integrated Hyper Probe
JXA-iSP100 - integrated Super Probe
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xCLent IV is a fully integrated cathodoluminescence spectrometry system for JEOL electron microprobes.
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