Scanning Electron Microscope
SEM- Essential in Daily Lab Operation JSM-IT700HR Makes it Easy.
About Natural Lacquer: "Urushi Chemistry"
Features and Application Examples of Various Instrumental Analysis Methods:
Analysis of Urushiol Components: "Monomer Analysis"
Analysis of Natural Lacquer during Hardening: "Time-Course Analysis during Film Formation"
Comparison of Natural Lacquer Films Formed under Different Conditions: "Comparative Analysis"
Heat Resistance Assessment of a Natural Lacquer Film: "Thermal Degradation Analysis"
Detection of Polysaccharide (Plant Gum) : "Trace Components or Additives Analysis"
A New Atomic Resolution Electron Microscope has been released! The "GRAND ARM™" has been upgraded. This new "GRAND ARM™2" enables observation at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages.
Field Emission Electron Probe Microanalyzer (FE-EPMA)
JXA-iHP200F is integrated EPMA with enhanced features, achieving more efficient operations from observation to analysis.
Here are some interviews with JEOL customers.
xCLent IV is a fully integrated cathodoluminescence spectrometry system for JEOL electron microprobes.
Here are the developments of "YOKOGUSHI" strategies which JEOL is pushing forward with.
Here are some examples of how JEOL products are utilized by our customers.
INTRODUCTION TO JEOL PRODUCTS
Welcome to the world of science.
Here are the background of JEOL's products development.
"Moving into the future with an evolution of reliability"