In 2019, JEOL Ltd. celebrated its 70th anniversary since its founding.“Evolving in the 70th Year” is the new guideline that we should follow.
Morphology Observation & Surface Analysis Instruments
Chemical Analysis Instruments
GC-MS / NMR
Roll to Roll Electron Beam Deposition Systems
RF Induction Thermal Plasma System for Nano Particle Synthesis
Lithium Ion Batteries
Nanopowder Synthesis Systems
The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". The JCM-7000 incorporates three innovative functions; "Zeromag" for smooth transition from optical to SEM imaging, "Live Analysis” for finding constituent elements for an image observation area, and "Live 3D" for displaying a reconstructed live 3D image during SEM observation.
The JIB-4000PLUS is a focused ion beam milling & imaging system (single-beam FIB system) featuring a high-performance ion optical column. In addition, the JIB-4000PLUS can be equipped with a 3D observation function and an automatic TEM specimen preparation function; thus the system meets a variety of needs for specimen preparations.
xCLent IV is a fully integrated cathodoluminescence spectrometry system for JEOL electron microprobes.
INTRODUCTION TO JEOL PRODUCTS
Welcome to the World of Science.
By collaborating with universities and institutes, JEOL is promoting scientific research.
KAZATO RESEARCH FOUNDATION
For supporting young researhers using electoron microscopes.