The JIB-4000PLUS is a focused ion beam milling & imaging system (single-beam FIB system) featuring a high-performance ion optical column. In addition, the JIB-4000PLUS can be equipped with a 3D observation function and an automatic TEM specimen preparation function; thus the system meets a variety of needs for specimen preparations.
Triple Quadrupole Mass Spectrometer
High speed and high sensitive analysis was achieved by JEOL’s proprietary technologies. JMS-TQ4000GC was developed with all technologies and experience that were brewed in the development of high-end GC-MS of JEOL.
- Fast Pixelated Detectors: A New Era for STEM
- Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy
- Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
- Electronic State Analysis by Monochromated STEM-EELS
- Chemical State Analyses by Soft X-ray Emission Spectroscopy
Fast observation, analysis and report generation!
JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope(TM), with significantly higher throughput.
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JEOL Ltd. express ourselves that we as JEOL Ltd. and any of our affiliates have concluded no agency relationship and no contractual relationship with Ervin Danesh Aryan Company in Islamic Republic of Iran on our manufactures and sell, services and any others in all cases in the past and current business.
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"Moving into the future with an evolution of reliability"