• CONTACT
  • REGIONAL SITE
  • NEWS LETTER
JEOL
  • PRODUCTS
  • APPLICATIONS NOTES
  • SUPPORT
  • ABOUT US
PRODUCTS
  • Transmission Electron Microscopes
    • Transmission Electron Microscope (TEM)
    Scanning Electron Microscopes
    • Scanning Electron Microscope (SEM)
    Ion Beam Application Equipment
    • Specimen Preparation Equipment
    • MultiBeam System (SEM-FIB)
    Instruments for Microarea and Surface Analysis
    • Electron Probe Microanalyzer (EPMA)
    • Auger Microprobe (Auger)
    • Photoelectron Spectrometer (ESCA)
  • Magnetic Resonance Equipment
    • Nuclear Magnetic Resonance
      Spectrometer (NMR)
    • Electron Spin Resonance
      Spectrometer (ESR)
    X-ray Fluorescence Spectrometers
    • X-ray Fluorescence Spectrometer (XRF)
    Mass Spectrometers (MS)
    • GC-MS、Gas Analysis MS
    • LC-MS(DART™-MS)、MALDI-TOFMS
    • Software
  • Semiconductor Equipment
    • Electron Beam Lithography System (EB)
    3D Printer
    • Electron Beam Metal AM Machine
    Industrial Equipment for thin-film formation and material processing
    • Thin Film Formation Equipment (E-Beam and Plasma Sources, etc.)
    • Material Processing Equipment (For Metal Melting and Nanopowder Synthesis, etc.)
    Clinical Chemistry Analyzers
    • Clinical Chemistry Analyzer (CA)
APPLICATIONS NOTES
  • Basic Research Chemistry Automobile Chemicals Glass, Ceramics, Cement
  • Education Battery, Energy Semiconductor and Electronic Parts Rubber, Plastic
  • Medicine, Life Environment, Asbestos Food Metal
Search By Product Group
About Us
  • About Us Social Activities Initiatives for the SDGs
  • Environment Activities Open Innovation News
  • Investor Relations Event / Exhibition
JEOL
PRODUCTS
  • Transmission Electron Microscopes
    • Transmission Electron Microscope (TEM)
  • Magnetic Resonance Equipment
    • Nuclear Magnetic Resonance
      Spectrometer (NMR)
    • Electron Spin Resonance
      Spectrometer (ESR)
  • Semiconductor Equipment
    • Electron Beam Lithography System (EB)
  • Scanning Electron Microscopes
    • Scanning Electron Microscope (SEM)
  • 3D Printer
    • Electron Beam Metal AM Machine
  • Ion Beam Application Equipment
    • Specimen Preparation Equipment
    • MultiBeam System (SEM-FIB)
  • X-ray Fluorescence Spectrometers
    • X-ray Fluorescence Spectrometer (XRF)
  • Industrial Equipment for thin-film
    formation and material processing
    • Thin Film Formation Equipment
      (E-Beam and Plasma Sources, etc.)
    • Material Processing Equipment
      (For Metal Melting and Nanopowder Synthesis, etc.)
  • Instruments for Microarea and
    Surface Analysis
    • Electron Probe Microanalyzer (EPMA)
    • Auger Microprobe (Auger)
    • Photoelectron Spectrometer (ESCA)
  • Mass Spectrometers
    • GC-MS、Gas Analysis MS
    • LC-MS(DART-MS)、MALDI-TOFMS
    • Software
  • Clinical Chemistry Analyzers
    • Clinical Chemistry Analyzer (CA)
APPLICATIONS NOTES
  • Basic Research
  • Education
  • Medicine, Life
  • Chemistry
  • Battery, Energy
  • Environment, Asbestos
  • Automobile
  • Semiconductor And Electronic Parts
  • Food
  • Chemicals
  • Rubber, Plastic
  • Glass, Ceramics, Cement
  • Metal
  • Search By Product Group
SUPPORT
ABOUT US
  • About Us
  • Environment Activities
  • Investor Relations
  • Social Activities
  • Open Innovation
  • Initiatives for the SDGs
  • Event / Exhibition
  • News
  • JEOL NEWS JEOL NEWS

    JEOL NEWS

    Vol.57 No.01

  • JMS-Q1600GC JMS-Q1600GC
  • JMS-Q1600GC JMS-Q1600GC

    Gas Chromatograph Quadrupole Mass Spectrometer

    JMS-Q1600GC

    UltraQuad™ SQ-Zeta

  • JSM-IT510 JSM-IT510

    Scanning Electron Microscope

    JSM-IT510

    InTouchScope™

  • JNM-ECZL JNM-ECZL

  • JAM-5200EBM JAM-5200EBM

    Electron Beam Metal AM Machine

    JAM-5200EBM

  • JEM-3300 (CRYO ARM™ 300 II) JEM-3300 (CRYO ARM™ 300 II)

    "CRYO ARM™ 300 II"

     JEM-3300

    Field Emission Cryo-Electron Microscope

  • Interview

  • Environmental countermeasure for analytical instruments

  • JEOL New Products

  • Event / Seminar

  • Movies from Past JEOL Webinars

  • USERS VOICE

  • Introduction to JEOL Products

  • NMR CHALLENGE

CAUTION

  • 2020/03/31 Magnet maintenance advice in the wake of COVID-19 restrictions.
  • 2017/05/30 JEOL Ltd. express ourselves that we as JEOL Ltd. and any of our affiliates have concluded no agency relationship and no contractual relationship with Ervin Danesh Aryan Company in Islamic Republic of Iran on our manufactures and sell, services and any others in all cases in the past and current business.

NEWS

  • 2022/08/17
    The University of Queensland (Australia) joins the global CRYO ARM™ user group
  • 2022/08/12
    Update: JASIS 2022
  • 2022/08/12
    SEMICON® Japan 2022
  • 2022/08/12
    [Kansai] Battery Japan
  • 2022/08/12
    JIMTOF2022 (The 31st JAPAN INTERNATIONAL MACHINE TOOL FAIR)
News Index

Seminar / Webinar

  • 2022/08/15

    A Practical Introduction to Diffusion-Ordered Spectroscopy

    Event Date:9/7(Wed)

  • 2022/06/22

    SMILEQ Plugin in JASON Software for Automated Quantitative NMR System

    Event Date:7/26(Tue)

  • 2022/06/06

    Goldilocks and the Three GC-MS Systems: Which One is "Just Right" for a Given Application?

    Event Date:6/23(Thu)

  • 2022/04/07

    Quantitative 13C NMR

    Event Date:5/4(Wed)

  • 2022/03/15

    Webinar Series: The Analytical Landscape of Cannabis Testing Session 4: Residual Solvents & Terpenes by GC-MS

    Event Date:4/20(Wed)

Seminar / Webinar Index
  • Glossary of TEM Terms
  • Glossary of SEM Terms
  • Event / Exhibition
  • YOUTUBE
  • facebook
  • twitter
  • twitter
  • Social Media accounts Social Media
    accounts
PRODUCTS
  • PRODUCTS TOP
  • New Products
  • Products lineup
  • Catalogue Download
  • Supply
  • Interview
  • Featured users
  • Development secrets
  • Glossary of TEM Terms
  • Glossary of SEM Terms
APPLICATIONS NOTES
  • APPLICATIONS NOTE TOP
  • JEOL NEWS
  • YOKOGUSHI
  • Applications of Discontinued Products
  • Introduction to JEOL Products
  • Amazing Nano World
SUPPORT
  • Request Product INFO
  • Environmental countermeasure for analytical instruments
ABOUT US
  • ABOUT US TOP
  • About Us
  • Environment Activities
  • Investor Relations
  • Social Activities
  • Open Innovation
  • Initiatives for the SDGs
  • Event / Exhibition
    • Movies from Past JEOL Webinars
  • Seminar / Webinar
JEOL
Privacy Statement Terms Of Use Social Media Policy Sitemap Copyright © 1996-2022 JEOL Ltd. All Rights Reserved.