JEOL NEWS
JEOL NEWS

Latest issue Vol.55 No.1

UrushiNote
UrushiNote

About Natural Lacquer: "Urushi Chemistry"
Features and Application Examples of Various Instrumental Analysis Methods:
TEM/SEM/XPS/ESR/NMR/MS/FT-IR
Analysis of Urushiol Components: "Monomer Analysis"
Analysis of Natural Lacquer during Hardening: "Time-Course Analysis during Film Formation"
Comparison of Natural Lacquer Films Formed under Different Conditions: "Comparative Analysis"
Heat Resistance Assessment of a Natural Lacquer Film: "Thermal Degradation Analysis"
Detection of Polysaccharide (Plant Gum) : "Trace Components or Additives Analysis"

JIB-4700F

Multi Beam System

JIB-4700F

Toward Seamless Observation and Analysis
JSM-IT800 Field Emission Scanning Electron Microscope
JEM-ARM300F2 GRAND ARM™2 Atomic Resolution Analytical Microscope
JEM-ARM300F2
GRAND ARM™2

A New Atomic Resolution Electron Microscope has been released! The "GRAND ARM™" has been upgraded. This new "GRAND ARM™2" enables observation at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages.

CAUTION

NEWS

News Index
Glossary of TEM Terms
Glossary of SEM Terms
Event / Exhibition
INTERVIEW

INTERVIEW

Here are some interviews with JEOL customers.

 YOKOGUSHI

YOKOGUSHI

Here are the developments of "YOKOGUSHI" strategies which JEOL is pushing forward with.

 CASES

USERS VOICE

Here are some examples of how JEOL products are utilized by our customers.

 Introduction to JEOL Products

INTRODUCTION TO JEOL PRODUCTS

Welcome to the world of science.

Development secrets

DEVELOPMENT SECRETS

Here are the background of JEOL's products development.

 NMR Challenge

NMR CHALLENGE

"Moving into the future with an evolution of reliability"