JEOL Ltd.

JIB-4000PLUS Focused Ion Beam Milling & Imaging System

The JIB-4000PLUS is a focused ion beam milling & imaging system (single-beam FIB system) featuring a high-performance ion optical column. In addition, the JIB-4000PLUS can be equipped with a 3D observation function and an automatic TEM specimen preparation function; thus the system meets a variety of needs for specimen preparations.

JMS-TQ4000GC

Triple Quadrupole Mass Spectrometer
High speed and high sensitive analysis was achieved by JEOL’s proprietary technologies. JMS-TQ4000GC was developed with all technologies and experience that were brewed in the development of high-end GC-MS of JEOL.

JEOL NEWS Vol.53

Fast Pixelated Detectors: A New Era for STEM
Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy
Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
Electronic State Analysis by Monochromated STEM-EELS
Chemical State Analyses by Soft X-ray Emission Spectroscopy

and more...

JSM-IT200

Fast observation, analysis and report generation!
JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope(TM), with significantly higher throughput.