JEOL Ltd.

Electron Beam Metal AM Machine

JAM-5200EBM
High Performance Gas Chromatograph
- Time-of-Flight Mass Spectrometer

JMS-T2000GC

"AccuTOF™ GC-Alpha"
"CRYO ARM™ 300 II"

JEM-3300

Field Emission Cryo-Electron Microscope
JEM-ARM300F2 GRAND ARM™2

A New Atomic Resolution Electron Microscope has been released!
The "GRAND ARM™2" has been upgraded.
This new "GRAND ARM™2" enables observation at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages.
URUSHI Note

About Natural Lacquer: "Urushi Chemistry"
Features and Application Examples of Various Instrumental Analysis Methods:
TEM/SEM/XPS/ESR/NMR/MS/FT-IR
Analysis of Urushiol Components: "Monomer Analysis"
Analysis of Natural Lacquer during Hardening: "Time-Course Analysis during Film Formation"
Comparison of Natural Lacquer Films Formed under Different Conditions: "Comparative Analysis"
Heat Resistance Assessment of a Natural Lacquer Film: "Thermal Degradation Analysis"
Detection of Polysaccharide (Plant Gum) : "Trace Components or Additives Analysis"
APPLICATIONS NOTE

JEOL, a world-leading high-end scientific instruments manufacture,
provides a wealth of applications and technical
information so that these solutions support our customers rapidly and optimally.

CAUTION

NEWS

News Index

Seminar / Webinar

2021/05/25

JASON a novel NMR tool

Event Date:7/6(Tue)
2021/05/12

Introduction to Solid-State Nuclear Magnetic Resonance Spectroscopy and Applications

Event Date:5/26(Wed)
2021/04/16

Introduction to solid-state MAS NMR

Event Date:5/28(Fri)
2021/04/05

CRYO ARM™ 300 II for cryo-EM in structural analyses of proteins and viruses

Event Date:4/8(Thu)
2021/03/05

A New Platform for GC-MS Analysis of Complex Samples

Event Date:3/16(Tue)

Seminar / Webinar Index