-
Electron Beam Metal AM Machine
JAM-5200EBM
-
High Performance Gas Chromatograph
- Time-of-Flight Mass SpectrometerJMS-T2000GC
"AccuTOF™ GC-Alpha"
-
"CRYO ARM™ 300 II"
JEM-3300
Field Emission Cryo-Electron Microscope
-
JEM-ARM300F2 GRAND ARM™2
A New Atomic Resolution Electron Microscope has been released!
The "GRAND ARM™2" has been upgraded.
This new "GRAND ARM™2" enables observation at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages. -
URUSHI Note
About Natural Lacquer: "Urushi Chemistry"
Features and Application Examples of Various Instrumental Analysis Methods:
TEM/SEM/XPS/ESR/NMR/MS/FT-IR
Analysis of Urushiol Components: "Monomer Analysis"
Analysis of Natural Lacquer during Hardening: "Time-Course Analysis during Film Formation"
Comparison of Natural Lacquer Films Formed under Different Conditions: "Comparative Analysis"
Heat Resistance Assessment of a Natural Lacquer Film: "Thermal Degradation Analysis"
Detection of Polysaccharide (Plant Gum) : "Trace Components or Additives Analysis" -
APPLICATIONS NOTE
JEOL, a world-leading high-end scientific instruments manufacture,
provides a wealth of applications and technical
information so that these solutions support our customers rapidly and optimally.
CAUTION
- 2020/03/31 Magnet maintenance advice in the wake of COVID-19 restrictions.
- 2017/05/30 JEOL Ltd. express ourselves that we as JEOL Ltd. and any of our affiliates have concluded no agency relationship and no contractual relationship with Ervin Danesh Aryan Company in Islamic Republic of Iran on our manufactures and sell, services and any others in all cases in the past and current business.
NEWS
- 2021/05/13
- 2021/05/13
- 2021/05/12
- 2021/05/10
- 2021/05/10
Seminar / Webinar
- 2021/05/12
- 2021/04/16
- 2021/04/05
- 2021/03/05
- 2021/02/17
