JEOL Ltd.

JIB-4000PLUS Focused Ion Beam Milling & Imaging System

JIB-4000PLUS

The JIB-4000PLUS is a focused ion beam milling & imaging system (single-beam FIB system) featuring a high-performance ion optical column. In addition, the JIB-4000PLUS can be equipped with a 3D observation function and an automatic TEM specimen preparation function; thus the system meets a variety of needs for specimen preparations.

JMS-TQ4000GC GC Triple Quadrupole Mass Spectrometer

JMS-TQ4000GC

Triple Quadrupole Mass Spectrometer
High speed and high sensitive analysis was achieved by JEOL’s proprietary technologies. JMS-TQ4000GC was developed with all technologies and experience that were brewed in the development of high-end GC-MS of JEOL.

JEOL NEWS Vol.53

Fast Pixelated Detectors: A New Era for STEM
Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy
Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
Electronic State Analysis by Monochromated STEM-EELS
Chemical State Analyses by Soft X-ray Emission Spectroscopy

New JEOL Benchtop Scanning Electron Microscope!

JSM-IT200 InTouchScope(TM) Scanning Electron Microscope

Fast observation, analysis and report generation!
JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScope(TM), with significantly higher throughput.

APPLICATIONS
NOTE

JEOL, a world-leading high-end scientific instruments manufacture,
provides a wealth of applications and technical information.

Glossary of
TEM Terms

Amazing
Nano World

(Specimen: Kidney of a mouse)

CAUTION

JEOL Ltd. express ourselves that we as JEOL Ltd. and any of our affiliates have concluded no agency relationship and no contractual relationship with Ervin Danesh Aryan Company in Islamic Republic of Iran on our manufactures and sell, services and any others in all cases in the past and current business.

NEWS

2019/02/19

ICMAT 2019
2019/02/15

Ionization Methods for JEOL Mass Spectrometers -A Guidebook-
2019/02/14

Gas analysis
2019/02/14

One term has been added and two terms have been improved in the Glossary of TEM Terms (Figures have been added).
2019/02/13

"Journal of Basic and Applied Research International" has been published CHARACTERIZATION OF A JAPANESE LACQUER FILM USING PY/MS, NMR AND TEM
2019/02/04

JEOL and FUJIFILM Corporation agreed on overseas sales tie-up for Clinical Chemistry Analyzer
2019/01/30

Nano Korea 2019
2019/01/30

2019 KSM Spring Meeting
2019/01/30

JEOL KOREA Users Meeting
2019/01/28

"Nature Materials" has been published the result of collaborative research with Tokyo Institute of Technology, RIKEN, High energy Accelerator Research Organization, Tohoku University, Tokyo University and JEOL RESONANCE Inc.

News Index

Glossary of TEM Terms

Event / Exhibition

INTERVIEW

Here are some interviews with JEOL customers.

YOKOGUSHI

Here are the developments of "YOKOGUSHI" strategies which JEOL is pushing forward with.

USERS VOICE

Here are some examples of how JEOL products are utilized by our customers.

Introduction to JEOL Products

INTRODUCTION TO JEOL PRODUCTS

Welcome to the world of science.

Development secrets

DEVELOPMENT SECRETS

Here are the background of JEOL's products development.

NMR CHALLENGE

"Moving into the future with an evolution of reliability"