JEOL Ltd.

Evolving in the 70th Year

In 2019, JEOL Ltd. celebrated its 70th anniversary since its founding.“Evolving in the 70th Year” is the new guideline that we should follow.

LIB Note

Morphology Observation & Surface Analysis Instruments
XRF/XPS/EPMA/AES/SEM/TEM/CP/FIB
Chemical Analysis Instruments
GC-MS / NMR
Fabrication Systems
Roll to Roll Electron Beam Deposition Systems
RF Induction Thermal Plasma System for Nano Particle Synthesis

BatteryNote

Lithium Ion Batteries
CP/XRF/SEM/AES/SXES/NMR/FIB/INFITOF/MS/XPS
Fuel Cells
TEM
Manufacturing Equipment
Nanopowder Synthesis Systems

JCM-7000 NeoScope™

The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". The JCM-7000 incorporates three innovative functions; "Zeromag" for smooth transition from optical to SEM imaging, "Live Analysis” for finding constituent elements for an image observation area, and "Live 3D" for displaying a reconstructed live 3D image during SEM observation.

JIB-4000PLUS

The JIB-4000PLUS is a focused ion beam milling & imaging system (single-beam FIB system) featuring a high-performance ion optical column. In addition, the JIB-4000PLUS can be equipped with a 3D observation function and an automatic TEM specimen preparation function; thus the system meets a variety of needs for specimen preparations.