JEM-ARM300F2 GRAND ARM™2 Atomic Resolution Analytical Microscope
JEM-ARM300F2
GRAND ARM™2

A New Atomic Resolution Electron Microscope has been released! The "GRAND ARM™" has been upgraded. This new "GRAND ARM™2" enables observation at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages.
Evolution of Integrated EPMA
Evolution of
Integrated EPMA

JXA-iHP200F - integrated Hyper Probe
JXA-iSP100 - integrated Super Probe
JSM-F100 Schottky Field Emission Scanning Elactron Microscope
JSM-F100 Schottky FE-SEM

The JSM-F100 incorporates not only our highly regarded In-lens Schottky Plus field emission electron gun and "Neo Engine" (electron optical control system), but also a new GUI "SEM Center" and an innovative "LIVE-AI (Live Image Visual Enhancer – Artificial Intelligence) filter". This enables an optimal combination of high spatial resolution imaging and high operability.

JEOL NEWS
JEOL NEWS

Latest issue Vol.54 No.1

APPLICATIONS
NOTE

JEOL, a world-leading high-end scientific instruments manufacture,
provides a wealth of applications and technical information.
Glossary of
TEM Terms

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CAUTION

NEWS

News Index
Glossary of TEM Terms
Event / Exhibition
70th

Evolving in the 70TH YEAR

70 years since our founding in 1949. In 2019, the phrase adopted as a new key concept for guiding company is "Evolving in the 70TH YEAR". Future JEOL - we introduce those who will bear the future of JEOL.

INTERVIEW

INTERVIEW

Here are some interviews with JEOL customers.

 YOKOGUSHI

YOKOGUSHI

Here are the developments of "YOKOGUSHI" strategies which JEOL is pushing forward with.

 CASES

USERS VOICE

Here are some examples of how JEOL products are utilized by our customers.

 Introduction to JEOL Products

INTRODUCTION TO JEOL PRODUCTS

Welcome to the world of science.

Development secrets

DEVELOPMENT SECRETS

Here are the background of JEOL's products development.

 NMR Challenge

NMR CHALLENGE

"Moving into the future with an evolution of reliability"