Adapting a JEM-2100F for Magnetic Imaging by Lorentz TEM
JEOLnews Volume 47, Number 1, 2012
Amit Kohn and Avihay Habibi
Department of Materials Engineering and the Ilse Katz
Institute for Nanoscale Science and Technology, Ben-Gurion
University of the Negev
Lorentz TEM enables to map quantitatively magnetic induction fields in the sample. A specifically designed objective lens, a coherent electron source, and a biprism filament can achieve magnetic imaging at the nanometer scale through off-axis electron holography experiments. However, this equipment is specialized and therefore not suited to many microscopy labs. In this article, we describe an adaptation of a conventional JEM-2100F for Lorentz phase microscopy, namely Fresnel-contrast imaging. Since a biprism filament is installed on this microscope, we evaluate the capabilities of the Fresnel-contrast magnetic imaging. We show that a relatively simple and low-cost adaptation enables quantitative magnetic and electrostatic mapping on a conventional TEM.
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