Adapting a JEM-2100F for Magnetic Imaging by Lorentz TEM

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JEOLnews Volume 47, Number 1, 2012 Amit Kohn and Avihay Habibi
Department of Materials Engineering and the Ilse Katz
Institute for Nanoscale Science and Technology, Ben-Gurion
University of the Negev

Lorentz TEM enables to map quantitatively magnetic induction fields in the sample. A specifically designed objective lens, a coherent electron source, and a biprism filament can achieve magnetic imaging at the nanometer scale through off-axis electron holography experiments. However, this equipment is specialized and therefore not suited to many microscopy labs. In this article, we describe an adaptation of a conventional JEM-2100F for Lorentz phase microscopy, namely Fresnel-contrast imaging. Since a biprism filament is installed on this microscope, we evaluate the capabilities of the Fresnel-contrast magnetic imaging. We show that a relatively simple and low-cost adaptation enables quantitative magnetic and electrostatic mapping on a conventional TEM.
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