Ultrahigh-Resolution STEM Analysis of Complex Compounds
JEOLnews Volume 45, Number 1, 2010
Eiji Abe†, Daisuke Egusa, Ryo Ishikawa, and Takehito Seki
Department of Materials Science & Engineering, University of Tokyo
Aberration-correction of the objective lens has been successful in converging the electron beam into sub-Å scale, and the scanning transmission electron microscopy (STEM) now routinely provides a remarkably improved spatial-resolution both for imaging and spectroscopy. Here we demonstrate the powerful use of the ultrahigh-resolution STEM for the analysis of complex compounds,including long-period modulated and aperiodic quasicrystalline structures.
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