Find Application:Sector (Industry)

Analysis of Asbestos –Distinguishing fine fiber one by one–

EM057

Bionote

Bio Solutions

Solid-State NMR Meets Electron Diffraction

NM170002

Photonic Crystal Lasers

JEOLnews Volume 49, Number 1, 2014

Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM

JEOLnews Volume 49, Number 1, 2014

Development of Aberration Corrected Differential Phase Contrast (DPC) STEM

JEOLnews Volume 49, Number 1, 2014

Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago

JEOLnews Volume 49, Number 1, 2014

Foodnote

Food Analysis Solutions

LIBnote

Lithium Ion Battery Note

High Resolution Imaging and Spectroscopy Using CS-corrected TEM with Cold FEG JEM-ARM200F

JEOLnews Volume 47, Number 1, 2012

Adapting a JEM-2100F for Magnetic Imaging by Lorentz TEM

JEOLnews Volume 47, Number 1, 2012

Electron Microscopic Study and X-ray Probe Microanalysis of the Liver of LEC Rat, an Animal Model of Wilson Disease

JEOLnews Volume 47, Number 1, 2012

Study of Nanoparticles at UTSA: One Year of Using the First JEM-ARM200F Installed in USA

JEOLnews Volume 46, Number 1,2011

Exploring Biological Samples in 3D Beyond Classic Electron Tomography

JEOLnews Volume 46, Number 1,2011

Development of JEM-2800 High Throughput Electron Microscope

JEOLnews Volume 46, Number 1,2011

JEM-2100: Applications in Nanotechnology

JEOLnews Volume 45, Number 1, 2010

Lithium Atom Microscopy at Sub-50pm Resolution by R005

JEOLnews Volume 45, Number 1, 2010

Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM

JEOLnews Volume 45, Number 1, 2010

Application of a Helium-Cooled Cryo-Electron Microscope for Single Particle Analysis

JEOLnews Volume 45, Number 1, 2010

Ultrahigh-Resolution STEM Analysis of Complex Compounds

JEOLnews Volume 45, Number 1, 2010