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Observation of biological specimen by JEM-1400Flash ｰ Flow from sample preparation to observation ｰ

EM2021-01

The most-viewed application note in 2020FY

CLEMnote

Correlative Light and Electron Microscopy note

High resolution TEM image by JEM-1400Flash

EM2020-11E

Ultrawide transmission electron microscopy image of a mouse kidney

EM2020-10E

Achieves the world’s highest level resolution with newly developed atomic resolution analytical electron microscope "GRAND ARM™2"

EM2020-09E

UrushiNote

Learning Polymer Material Analysis from Natural Lacquer (Urushi) - Characterization of Urushi -

The most-viewed application note in 2019FY

Visualization of hydrogen-bonding: Electron and NMR nano-crystallography

NM190004

BatteryNote

BatteryNote

JEOL NEWS Vol.53

JEOL NEWS Vol.53/ July 2018

Aberration-Corrected Scanning Transmission Electron Microscopy of La₂CuO₄-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy

JEOL NEWS Vol.53 No.2

Fast Pixelated Detectors: A New Era for STEM

JEOL NEWS Vol.53 No.1

Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials

JEOL NEWS Vol.53 No.8

Structural Analysis of Semiconductor Devices by Using STEM/EDS Tomography

JEOL NEWS Vol.53 No.7

X-ray, Electron and NMR Crystallography to Structural Determination of Small Organic Molecules

JEOL NEWS Vol.53 No.6

Electronic State Analysis by Monochromated STEM-EELS

JEOL NEWS Vol.53 No.4

Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences

JEOL NEWS Vol.53 No.3

Analysis of Asbestos –Distinguishing fine fiber one by one–

EM057

Bionote

Bio Solutions

Solid-State NMR Meets Electron Diffraction

NM170002

Photonic Crystal Lasers

JEOLnews Volume 49, Number 1, 2014

Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM

JEOLnews Volume 49, Number 1, 2014

Development of Aberration Corrected Differential Phase Contrast (DPC) STEM

JEOLnews Volume 49, Number 1, 2014

Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago

JEOLnews Volume 49, Number 1, 2014