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JEOL NEWS Vol.53

JEOL NEWS Vol.53/ July 2018

Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials

JEOL NEWS Vol.53 No.8

Chemical State Analyses by Soft X-ray Emission Spectroscopy

JEOL NEWS Vol.53 No.5

Bionote

Bio Solutions

Cross Sections of Noodles Observed at Various Cooling Temperatures

SM065

Observation Examples of Processed Foods

SM064

Observation of Bread Yeast with Cryo-SEM

SM063

MALDI Application: Analysis of organic thin films

Depth Profiling by Using Ag SALDI Mass Spectrometry Imaging and XPS

Electron Microprobe Study of the Yinxu (Anyang) Bronze of Academia Sinica Collection

JEOLnews Volume 49, Number 1, 2014

LIBnote

Lithium Ion Battery Note

Rapid Screening Tool for Mining

Scanning Electron Microscope A To Z

Basic Knowledge For Using The SEM

Application of Scanning Electron Microscope to Dislocation Imaging in Steel

JEOLnews Volume 46, Number 1,2011

Auger Analysis of CP Cross Section

Argon Beam Cross Sectioning

An Appraisal of High Resolution Scanning Electron Microscopy Applied To Porous Materials

Artifact-free cross-sections

Precise SEM Cross Section Polishing via Argon Beam Milling

Preparation of a High Quality Cross Section of a Bone Tissue for SEM

-Application of the Cross-section Polisher to a Biological Specimen-

Atmospheric Scanning Electron Microscopy (ASEM) Realizes Direct EM-OM Linkage in Solution: Aqueous Immuno-Cytochemistry

JEOLnews Volume 46, Number 1,2011

High Angle Backscattered Electrons and Low Angle Backscattered Electrons

Cross-sectioning of urethane rubber by an Ar broad ion beam for SEM imaging

Backscattered Electrons

Introducing the ALTO Series (Cryo System)

Introducing Cryo Scanning Electron Microscopy