Tuesday, November 7 - Friday, November 10, 2017
BEXCO in Busan, KOREA
Please be noticed that JEOL is due to make Lunch-on seminar at EMAC3 in the below schedule.
|Date||November 8th (WED)|
|Place||#321 + #322|
|Title||① In-Situ and analytical applications using an aberration corrected 300kV TEM
by Mr. Onishi of TEM application engineer
|② Transmission Electron Microscope equipped with latest aberration correction system ～NEOARM～
by Mr. Hashiguchi of TEM application engineer
|Date||November 9th (THU)|
|Title||① Introduction of the latest JEOL FEG-SEM
by Mr. Sakuda of SEM application engineer
|② Introduction of the JEOL’s new SEM, JSM-IT500HR
Nonstop! From Optical image to SEM high magnification alalysis
by Ms. Nakajima of SEM application engineer
Thank you very much for your kind attention.