Release of a New Schottky Field Emission Scanning Electron Microscope, JSM-7900F -High-End Next-Generation Analytical Tool, High-Performance FE-SEM successfully combining ultrahigh resolution and superbly high operability-

2017/05/30

JEOL Ltd. (President Gon-emon Kurihara) announces a new Schottky field emission scanning electron microscope, JSM-7900F, to be released in May 2017.

Product development background

Scanning electron microscopy has been in increasing demand in a wide range of applications including nanotechnology, metals, semiconductors, ceramics, medicine, and biology. As advanced materials feature an increasingly smaller, finer structure, scientists are in need of high resolution imaging as well as speedy, efficient data acquisition through easy operation. To meet these demands, the JSM-7900F combines ultra high spatial resolution imaging and ease of operation. The microscope consistently accomplishes high performance regardless of the skills or experience of the operator.

Main Features

  • In-lens Schottky plus field emission electron gun
    Enhanced integration of the gun and low aberration condenser lens provides higher levels of brightness. Ample probe current is available at low accelerating voltage, supporting various operations from high resolution imaging to high speed elemental mapping.
  • Super Hybrid Lens/SHL
    Super Hybrid Lens/SHL, a combination of electrostatic and electromagnetic lenses, supports ultra high resolution imaging and analysis of various samples ranging from magnetic materials to insulators.
  • New GBSH-S (GENTLEBEAM™ Super High Resolution Stage Bias mode)
    The GBSH-S stage enables ultrahigh resolution imaging at low accelerating voltage. The stage supports a variety of holders.
  • New Neo Engine (New Electron Optical Engine)
    Neo Engine is the new advanced electron optical system. Accuracies in automated controls have been enhanced significantly, improving ease of operation.
  • SMILENAVI - a new feature
    A powerful navigation system guides you through the data acquisition process. It helps the novice to master basic SEM operation steps.
  • New sample exchange system
    A new sample exchange system is designed to change samples in a safe, speedy, seamless manner through simple operation for beginners to experts.

Main Specifications

Resolution 0.6 nm (15 kV), 0.7 nm (1.0 kV), 1.0 nm (0.5 kV)
3.0 nm (5 kV, probe current 5 nA, WD 10 mm)
Magnification ×25 to ×1,000,000
Electron gun In-lens Schottky plus field emission electron gun
Accelerating voltage 0.01 kV to 30 kV
Probe current A few pA to 500 nA
JEOL_JSM-7900F

Annual unit sales target

100 units/year