Joint research with Tohoku University “Research and development of Soft X-Ray Emission Spectrometer and the construction of spectrum database” started.

2017/06/20

JEOL Ltd. (President Gon-emon Kurihara) and Tohoku University (President Susumu Satomi) formally started a collaboration on “Research and development of Soft X-Ray Emission Spectrometer and the construction of spectrum database” in April 1, 2017.

The Soft X-Ray Emission Spectrometer (SXES) is an ultra-high resolution spectrometer for electron microscope consists of a newly-developed diffraction grating and a high-sensitivity X-ray CCD camera. The analysis of Li-K emission from metal Li is possible, in the same way as EDS, parallel detection is possible, and 0.3 eV (Fermi-edge, Al-L standard) ultra-high energy resolution analysis can be performed, surpassing the energy resolution of WDS and JEOL Ltd. commercialize this product as “SXES”.

The purpose of this joint research is to contribute to the development on function materials etc and spread widely as a new analysis method to various material fields such as secondary batteries or high performance steel sheets both in Japan and overseas by developing and improving SXES further.

Fig.1 Outline of the Soft X-Ray Emission Spectrometer
(Left figure: System outline, Right figure: Spectra for TiN with various spectrometry methods)

Fig.2 Installation example for EPMA/SEM

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