A paper by a collaboration with Tokyo University of Science and JEOL Ltd. has been published in "Applied Physics Express"


Research by Division of Nanocarbon Research, RIST, TUS and JEOL Ltd. was published on "Applied Physics Express".
The precise imaging of the number of graphene layers was succeeded with energy filtered SEM using electron spectrometer of scanning Auger Microprobe (JAMP-9510F) 

"Determination of absolute number of graphene layers on nickel substrate with scanning Auger microprobe"
Appl. Phys. Express 13 015502