A paper using a JEM-2100 Ultrafast TEM by Sandia National Laboratory was posted in Microscopy TODAY


We are pleased to announce that the scientific paper titled as "Exploring Coupled Extreme Environments via In-situ Transmission Electron Microscopy" using the JEM-2100 Ultrafast TEM, the integrated system manufactured by JEOL and IDES, by Sandia National Laboratory and its corroborators was posted on Microscopy TODAY, January 2021 edition. 20.