2021/12/02
SEMICON® Japan 2021

JEOL will exhibit various scientific and metrology instruments including electron microscopes used for failure analysis and process development, as well as electron beam lithography system used for lithography.
We will also have functional demonstrations of the JSM-IT800 (i) / (is), a Schottky field emission scanning electron microscope which is suitable for the observation of semiconductor samples. We would like to take this opportunity to invite you to our booth.

Organizer: SEMI (Semiconductor Equipment and Materials International)
Official web site

Date / Venue

  • Date:
    Wednesday, 15 December - Friday, 17 December, 2021 (Open: 10:00 to 17:00)
  • Venue:
    Tokyo Big Sight, East Hall 4
    3-11-1 Ariake, Koto-ku, Tokyo 135-0063
    Map
  • Access to Tokyo Big Sight:
    Rinkai Line: Approx. 7 minutes' walk from Kokusai-Tenjijo Station
    Yurikamome: Approx. 3 minutes' walk from Tokyo Big Sight Station
  • JEOL Booth:
    No.4531

How to register (for SEMICON® Japan)

Please register here in advance(to go to an external site).

Contents of Exhibition

Failure Analysis & Process Development Products

Lithography

Global SEMICON®

We will also exhibit at SEMICON® Taiwan and SEMICON® China.