JED-2300 Analysis Station PlusThe JED-2300 Analysis Station Plus is equipped with JEOL’s DrySD™ (Dry Silicon Drift Detector), a high-speed analyzer, and analytical software specially designed for JEOL electron microscopes.
- Related Products
This EDS system is fully integrated with our SEMs, FIB-SEMs and TEMs for comprehensive data management (microscope images and X-ray data) with an easy-to-understand user interface.
For FIB-SEM systems equipped with motor drive stages, data management over large areas is facilitated with visualized operations, such as microscope images with different magnification or different stage position, and locations of elemental maps.
Icons are arranged from left to right which guide the user through each step of data collection. In addition, the functions of each icon are displayed for visual understanding.
♦Indexed image display
The operator can quickly access the acquired data from the indexed image display.
♦List of analysis data
Images and analysis results are automatically saved in the same folder for quick access. When the operator selects any area on the indexed image display, data for the respective areas will be displayed in the list of analysis data, thus simplifying data management.
Visual Peak ID
This function enables you to confirm whether the constituent elements are correctly identified in the qualitative analysis result. A spectrum is reconstructed by calculation based on the X-ray intensity of the elements identified in the qualitative analysis.
The peak shape of the Bi X-ray lines is found to be different between the acquired spectrum (pink) and the calculated spectrum (blue).
Re-examination of the Bi peak position indicated the presence of Pb. When Pb was added to the analysis results, the two peak shapes matched. From this result, Pb was confirmed to be contained in the specimen.
Play Back Analysis functions
Conventional elemental mapping acquires until there are sufficient X-ray counts and saves a spectrum where the accumulated counts of all frames for the spectrum are stored at each pixel. Play Back Analysis functions available for the JED-2300 Analysis Station Plus can replay this data like animation, after the acquisition of elemental maps. Thus, this function can help make a broad range of analyses. For example, you can confirm the presence or absence of specimen deformation during map acquisition or change of elements in a specimen during In-situ analysis such as heating.
Smile Station™ 2
Elemental maps are automatically acquired, allowing the user to select only necessary areas from a montaged image or multiple microscope images, thus allowing efficient analysis of complex areas.
Particle Analysis Software 2
♦Particle analysis function
Acquisition of morphological information on the detected featured-objects (specific particles, etc.) is enabled based on intensity differences in microscope image (backscattered electron composition image, etc.). These featured-objects can be subjected to automatic EDS analysis. Various featured-objects are analyzed by setting analysis conditions, including the intensity difference in the image, as well as size and shape. Combined use with Smile Station™ 2 enables automatic particle analysis over wide areas. This function also extends its applications to include: inclusions in mineral grains, distinguishing the featured-objects with a specific shape, and particles collected on filters.
For each particle, the EDS analysis results and particle-shape information (particle diameter, area, etc.) are recorded. You can create graphs or tables from the information for statistical processing.
♦Example of automatic analysis (asbestos)
Asbestos exhibits a high aspect ratio shape. The Particle Analysis Software 2 can select the aspect ratio to the asbestos (fibers) for EDS analysis and therefore, only the appropriate size and shape particles will be distinguished and measured. From the EDS analysis results, you can determine whether or not the analyzed needle-shape particle is asbestos and can classify the type of asbestos. You can also re-confirm the analysis results of each particle after the completion of analysis.
|Classified asbestos||Asbestos extracted by Particle Analysis Software|
Dry Silicon Drift Detector
Unlike conventional Si(Li) type EDS detectors, the Dry Silicon Drift Detector does not require liquid nitrogen. Maintenance is easier and the SDD allows higher X-ray count throughput. The use of the large area Dry Silicon Drift Detectors allows for elemental analysis even with a small probe current.
List of the Dry Silicon Drift Detectors
|Scanning Electron Microscope||Detection area||Energy resolution||Detectable elements|
133 eV or less
130 eV or less
25 mm2, 30 mm2
129 eV or less
- For the JSM-IT100 Series, the functions presented in this web page are applicable only when the JED-2300 Analysis Station Plus is installed on JSM-IT100 or JSM-IT100LV. Different analysis software is used for JSM-IT100A and JSM-IT100LA.
|Control PC||OS:Microsoft®Windows® ７ 32bit/64bit、
|Detector||SDD type||Select from the detector list||Only
|Ⅰ: Standard mode Ⅱ: Map mode Ⅲ: Montage mode
Ⅳ: Particle analysis mode Ⅴ: Large area particle analysis mode
|Spectral analysis||Qualitative/Quantitative analysis (ZAF correction, Thin film approximation for TEM)||●||●||●||●||●||●|
|Visual Peak ID (VID)||●||●||●||●||●||●|
|Chemical type classification, QBase(Qualitative Analysis Database)||●||●||●||●||●||●|
|Count rate & Dead time real-time display||●||●||●||●||●||●|
|Report generation||Single click report||●||●||●||●||●||●|
|Exporting to Microsoft® Word、Microsoft® PowerPoint®||●||●||●||●||●||●|
|Analysis Station||Data management||●||●||●||●||●||●|
|Analysis initiated on EDS monitor
(Analysis position set on the acquired image)
|Graphic display of analysis positions, Navigation, Pinpoint Navi||●||●||●||●||2|
|SEM integration||Automatic monitoring of microscope conditions
(Magnification, Accelerating voltage, Stage coordinate)
|SEM WD monitoring||●||●||●||●||1|
|Analysis position specified in the SEM monitor
(Direct analysis set on the SEM GUI.)
|Help function||Analysis assist||●||●||●||●||●|
|Line analysis||Line analysis, Quantitative line analysis||●||●||●||●||●|
|Large area line profile||●||●||●||●|
|Elemental map||Elemental map (Map with 3 colors, Probe tracking)||●||●||●||●||●|
|Height-definition image (4096 × 3072 pixels for electron microscope image and elemental map)||●||●||●||●||●|
|Pickup function for micro-area elements||●||●||●||●||●|
|Smile Station™ 2||Automatic sequential analysis||●||●||2|
|Automatic montage (SEM image, elemental map)||●||●||2|
|Automatic acquisition of elemental maps on multiple areas||●||●||2|
|Particle Analysis Software 2||Particle analysis (auto / manual) & EDS analysis||●||●|
|Statistical processing (analysis results, particle diameter, area, etc.)||●||●|
|Sequential particle & EDS analysis on multiple areas||●||3|
|GSR analysis||Automated Gunshot Residue (GSR) analysis||●||3、4|
|Improved accuracy of quantitative analysis for specimens containing light and heavy elements||○||○||○||○||○||○|
|Monitoring of probe current, compensation for probe current fluctuations||○||○||○||○||○||5|
|Acquisition of user standard||○||○||○||○||○||5|
|Swing mouse||One set of mouse & keyboard control for two PCs (SEM & EDS)||○||○||○||○||○|
|Offline analysis||License software for offline data analysis||○||○||○||○|
|Built-in software||Standard software||●||●||●||●||●||●|
|Digital mapping software||●||●||●||●||●|
|Smile Station™ 2||●||●|
|Particle Analysis Software 2||●||●|
*1 Applicable only to JSM-IT300HR LA.
*2 Applicable to SEMs with the motor drive stage. Not applicable to JSM-6000Plus.
*3 Applicable to SEMs with the motor drive stage of XYZ 3-axes or more axes.
*4 To perform calibration, the optional GSR unit is required.
*5 The optional probe current compensation unit is required. Automatic monitoring of the probe current is possible only
when EDS is connected to the microscope PC. FE-SEMs that include PCD and AEI do not require this unit.
*6 For JSM-IT300HR LA and JCM-6000 series, EDS software is installed into a PC for the microscope basic unit. Thus in
this case, a PC dedicated to EDS is not required.
Specifications subject to change without notice.
Microsoft, Windows and PowerPoint are registered trademarks of Microsoft Corporation in USA and other countries.