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Features

JEM-ARM300F2 GRAND ARM™2 Atomic Resolution Analytical Microscope

A New Atomic Resolution Electron Microscope has been released!
The "GRAND ARM™" has been upgraded.
This new "GRAND ARM™2" enables observation at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages.

The newly developed FHP2 objective lens pole piece combines ultrahigh spatial resolution and highly sensitive X-ray analysis

The FHP objective lens pole piece, for observation at ultrahigh spatial resolution, has been upgraded.

  • Highly sensitive X-ray analysis can be performed at ultrahigh spatial resolution.
    Compared with the previous FHP, more than double the X-ray detection efficiency (Total solid angle of 1.4 steradians) can be achieved with the FHP2.
  • Low optical coefficients, low Cc coefficient & low Cs coefficient enable ultrahigh spatial resolution and highly sensitive X-ray analysis to be performed over a wide range of accelerating voltages.
    (Guaranteed STEM resolution: 53pm @300kV, 96 pm @80kV)*
*This is the case when the STEM Expanding Trajectory Aberration (ETA) Corrector is incorporated.

The WGP objective lens pole piece enables ultrahighly sensitive X-ray analysis and various types of In-situ experiments to be performed.

The WGP, which has a wide gap between its upper pole and its lower pole, is also available.

Because of a wide gap , the WGP enables,
  • Large sized SDDs to be brought closer to the specimen, allowing ultrahighly sensitive X-ray analysis to be performed. (Total solid angle of 2.2 steradians)
  • Thick special specimen holders are able to fit within the pole piece gap, making it possible for various types of In-situ experiments to be performed.

JEOL Cs corrector & Corrector System Module (JEOL COSMO™)

Cs correctors developed by JEOL are used on the GRAND ARM™2.

Incorporating the FHP2 into this system can achieve a STEM spatial resolution of 53pm, and using the WGP with this system can achieve a STEM spatial resolution of 59pm. (@300kV)
JEOL COSMO™, Corrector System Module, makes it possible to execute aberration correction easily and quickly.

Cold Field Emission Electron Gun (CFEG) provided as a standard

CFEG, a highly stabilized cold field emission electron gun with a smaller energy spread is equipped as standard.

An enclosure not affected by external disturbances

This new enclosure is standard in order to reduce external disturbances such as air flow, changes of room temperature and acoustic noise.

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Specifications

Main Specifications

Version Ultra-high resolution
configuration
High resolution
configuration
Objective lens
polepiece
FHP2 WGP
Standard
Accelerating
Voltage
300kV, 80kV
Electron gun Cold field emission gun
STEM Resolution 300kV / 80kV STEM Cs corrector installed
53pm / 96pm  59pm / 111pm 
TEM Resolution 300 kV / 80 kV TEM Cs corrector installed
Lattice resolution 50pm / - Lattice resolution 60 pm / -
Non-linear information limit
60pm / 90pm
Non-linear information limit
70pm / 100pm
Linear information limit
90pm / 160pm 
Linear information limit
100pm / 170pm
Maximum tilt
angle
When using JEOL specimen tilting holder for analyses
X:± 30°/ Y:± 27° X:± 36°/ Y:± 31°
When using High tilt specimen holder
X:± 90° X:± 90°

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