- Mass Spectrometer
- GC-MS: JMS-T200GC AccuTOF™ GCx-plus High Performance Gas Chromatograph – Time-of-Flight Mass Spectrometer
GC-MS: JMS-T200GC AccuTOF™ GCx-plus High Performance Gas Chromatograph – Time-of-Flight Mass Spectrometer
High Performance Gas Chromatograph – Time-of-Flight Mass Spectrometer
- Related Products
The AccuTOF™ GCx-plus provides solutions in a variety of applications.
High throughput analysis results offered by a new automatic analysis system
The JMS-T200GC AccuTOF™ GCx-plus GC-TOFMS is a high-end GC-MS system, which achieves high mass resolution, high mass accuracy, high sensitivity, fast data acquisition, and wide mass range.
A new automatic analysis system provides high-throughput, high-accuracy qualitative analysis solutions.
Three key technologies for achieving automatic qualitative analysis
Three new functions are incorporated in the new GC-MS system, which allows high-accuracy qualitative results to be obtained by anyone.
Technology 1: Integrated analysis of GC/EI data and soft ionization data
The new automatic analysis software “msFineAnalysis” conducts five kinds of qualitative analyses that combine GC/EI data and soft ionization data (CI, FI, PI).
- Library search
- Molecular ion search
- Accurate mass analysis
- Isotope pattern analysis
- EI fragment ion analysis
By presetting "m/z" value used for drift correction and timing to introduce the internal standard sample, drift correction is automatically implemented after measurement. Since the measured data are already subjected to drift correction, these data are immediately analyzed by “msFineAnalysis” software.
Linkage of GC/EI data and GC/FI data
Integrated analysis result
Technology 2: Reservoir Automatic ON/OFF function
Valve control can be made through the software.
The timing to introduce the internal standard sample, aimed at mass calibration (drift correction), can be set flexibly.
Reservoir Automatic ON/OFF
Technology 3: Drift correction multiplier
Multi-point correction using a drift correction multiplier achieves high mass accuracy. This drift correction multiplier can be linked to the Reservoir Automatic ON/OFF function.
This automatic system provides higher accuracy GC-MS qualitative analysis results than the results obtained only from library search. The system offers both shortened data analysis time and superbly high accuracy analysis results.
Various soft ionization techniques and direct analysis to support qualitative analysis
The AccuTOF™ GCx-plus accommodates various soft ionization techniques, as well as Electron Ionization (EI).
These soft ionization techniques are also effective for the integrated analysis using “msFineAnalysis” software.
Two combination ionsources enable quick switching between EI and soft ionization without degrading the vacuum in the chamber.
In addition, the AccuTOF™ GCx-plus allows for analysis with direct techniques including Direct Exposure Probe (DEP), Direct Insertion Probe (DIP) and Field Desorption (FD). The system also supports direct sample inlets for analysis of low volatile compounds and high boiling-point compounds.
|For GC-MS||Electron Ionization (EI), Chemical Ionization (CI), Photoionization (PI), Field Ionization (FI)|
|For Direct MS||Desorption Electron Ionization (DEI), Desorption Chemical Ionization (DCI), Field Desorption (FD)|
EI/FI/FD combination ion source
EI/PI combination ion source
Fast data acquisition for GCxGC-TOFMS analysis
High speed data acquisition speed, up to 50 spectra/sec, is suitable for GCxGC-TOFMS analysis that provides ultrahigh separation data. This GCxGC analysis can also be made with soft ionization. Ultrahigh separation analysis offered by GCxGC is effective for analyzing complex-mixed compounds measurement.
Easy linkage to various pre-treatment equipment
The AccuTOF™ GCx-plus enables analysis by combinations with various pre-treatment equipment, like the JMS-Q1500GC (GC-QMS) does.
Thus, its applications extend by the combinations with Head space method, SPME method, Pyrogenic method, and Thermogravimetry.
High basic performance
Trace amount of components can be analyzed qualitatively and quantitatively.
Octafluoronaphthalene (OFN) 100 fg was continuously measured (8 cycles) by EI method and EIC (m/z 271.9867) was acquired. Based on the repetition accuracy of the obtained peak area of this EIC, statistical calculation was conducted for the instrument detecting lower limit (IDL) by assuming certain reliability, resulting in 16 fg of IDL.
CV: Coefficient of Variation, IDL: Instrument Detecting lower Limit
Superposition and reproducibility of EIC for OFN data
High mass accuracy
Accurate mass analysis of the detected ions enables the chemical formula of ion to be obtained.
Mass accuracy of the measured sample with different concentrations
Stability over long periods of time
The system allows for separation of adjacent mass peaks with a few 10 mm Da.
Figure below shows that four kinds of ions having the same integer mass of 28 Da are clearly separated and detected owing to high resolution of the system. With a low resolution system, these ions are not separated and detected and thus, the observed mass peak is only one, leading to non-accurate acquisition of elemental composition and intensity (quantitative value).
The AccuTOF™ GCx-plus enables accurate qualitative and quantitative analyses by separating adjacent mass peaks with a few 10 mm Da.
Evolved gas analysis of Nylon 66
Fast data acquisition
The system supports GCxGC analysis and Fast GC analysis with a high speed data acquisition up to 50 spectra/sec.
GCxGC / EI&FI data of Tee tree oil
Fast GC data of 57 components of phosphorus-based agricultural chemicals (bottom)
Wide mass range
The AccuTOF™ GCx-plus has a wide mass range and incorporates various direct sample-inlet techniques, thus allowing for measurement of samples with large molecular weight, which cannot be introduced by GC.
FD mass spectrum of polystyrene 5200
The AccuTOF™ GCx-plus has a wide mass range up to 4 orders of magnitudes, thus the system fully supports quantitative analysis as a GC-MS.
Calibration curve for OFN 0.1 to 1000 pg
Optional software systems to support analyses
*1:GC Image Corporation *2:Sierra Analytics Corporation *3:SpectraWorks Corporation