GC-MS: JMS-T200GC AccuTOF™ GCx-plus High Performance Gas Chromatograph – Time-of-Flight Mass Spectrometer
GC-TOFMS & Direct TOFMS with high speed, high resolving power, and high mass accuracy.

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GC-MS: JMS-T200GC AccuTOF™ GCx-plus High Performance Gas Chromatograph – Time-of-Flight Mass Spectrometer
The AccuTOF™ GCx-plus is the most advanced mass spectrometer system of the AccuTOF™ GC series products.
The AccuTOF™ GCx-plus provides solutions in a variety of applications.

Reliable determination of elemental composition

The high-resolution and high mass accuracy AccuTOF™ GCx-plus enables accurate elemental composition determination, which is a powerful tool for the qualitative analysis of unknown compounds and impurities.

High resolution

High mass accuracy (at different concentrations, single ion)

Stable mass accuracy over time

High sensitivity

100 fg of octafluoronaphthalene (OFN) was measured continuously 8 times. From the standard deviation of the EIC peak areas of OFN molecular ions, an instrument detection limit (IDL) of 16 fg was calculated.
CV: Coefficient of variation    IDL: Instrument detection limit 

Wider mass range

Oligomer analysis with direct MS

The AccuTOF™ GCx-plus, with a wide mass range and direct inlet system, can analyze samples with large molecular weights that are difficult to handle with GC.


A variety of ionization and sample introduction techniques

FI and FD - Ideal soft ionization techniques for molecular weight determination

FI and FD are ionization techniques with a low level of internal energy in molecular ions compared to EI and CI.
Being soft ionization techniques with minimum fragmentation, FI and FD are ideal for molecular weight determination.

FI(Field Ionization)

  • The sample is introduced to the ion source through GC or a standard sample inlet system.
  • Unlike CI, FI uses no reagent gas; no need to choose a reagent gas appropriate for the analyte.

Molecular ions of fluorine compounds that are prone to fragmentation were detected.

FD(Field Desorption)

  • The sample is applied onto the emitter and directly introduced to the system.
  • Suitable for analysis of thermally labile compounds.
  • Ideal for samples soluble in nonpolar solvents.
  • Analyzes powder samples dispersible in solvents.
  • Analyzes low- to mid-polar metal complexes.
  • Analyzes high molecular weight samples not supported in GC/MS, such as polymer.

Information on molecular weight was rapidly acquired from nonvolatile ionic liquid.

EI/FI/FD combination ion source (optional)

JEOL's unique ion source combining EI, FI, and FD ionization allows for GC/EI, GC/FI, and FD analysis without changing the ion source. The single ion source supports highly productive analysis without breaking the vacuum.

Direct sample inlet system (optional)

2 types of direct sample inlet probes for different applications
EI and CI supported

DEP (Direct Exposure Probe)

  • Ideal for high boiling point/thermally unstable compounds
  • The sample, which is dissolved in a solvent, is applied to the filament at the tip.

DIP (Direct Insertion Probe)

  • Ideal for high boiling point compounds/samples insoluble in solvent
  • A solid sample can be directly introduced to a dedicated glass sample tube for analysis.

Qualitative analysis combining EI and FI

The EI mass spectrum allows for library search. The elemental composition of fragment ions results in structural information. Meanwhile, molecular ions detected in FI suggest the molecular weight and elemental composition. By combining the information resulting from EI and FI, one can achieve highly accurate qualitative analysis without relying solely on library search. The combined technique is effective in qualitative analysis of unknown components such as impurities.



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