JSX-1000S X-ray fluorescence spectrometer(XRF)
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Features

JSX-1000S in motion
Click the "replay" button in the box above, and the movie will start(for 4 minutes)
Simple Operation
Simply set the sample and touch the screen; that’s how easy it is to operate. Another touch of the screen is all it takes to switch between analysis results and spectrum display. It is as easy to operate as a tablet PC or a smart phone. (Operation using a keyboard and a mouse is also supported.)
Set & Touch simple operation
A simple, intuitive operation GUI

High Sensitivity & High Throughput
JEOL’s own SDD (silicon drift detector) and newly-developed optical system, in combination with filters designed to handle the entire energy range, make it possible to achieve high-sensitivity analysis.
The sample chamber vacuum unit (option) further increases detection sensitivity for lighter elements.
Sensitive analysis throughout the entire energy range

Example: trace element detection (10 ppm or less)

Providing Solutions
With solution based applications, the desired analysis can be executed automatically according to pre-recorded recipes. Simply select the desired solution icon from the solution application list for automated analysis and display of results. Solution applications offer simplified analysis in a wide range of fields.
(The residual balance correction and thickness correction functions are only applicable to organic samples.)
Thickness | Crrection | Cr | Zn | Cd | Pb | Automatic balance |
0.5mm | No | 0.008 | 0.037 | 0.001 | 0.002 | 99.76 |
3.8mm | 0.012 | 0.109 | 0.004 | 0.006 | 99.64 | |
0.5mm | Yes | 0.011 | 0.137 | 0.015 | 0.010 | 99.54 |
3.8mm | 0.011 | 0.134 | 0.016 | 0.011 | 99.55 | |
Standard value | 0.010 | 0.125 | 0.014 | 0.010 |
Specifications
Analysis element range | Mg~U |
---|---|
F~U (Option) | |
X-ray generator | 5 to 50 kV, 1 mA |
Target | Rh |
Primary filter: 9 types, Automatic exchange | Standard:OPEN, ND, Cr, Pb, Cd |
Option:Cl, Cu, Mo, Sb | |
Collimator: 3 types, Automatic exchange | 0.9mm, 2mm, 9mm |
Detector | Silicon drift detector (SDD) |
Specimen chamber size | 300mm(D)×80mm(H) |
Specimen chamber atmosphere | AIR / VAC (Option) |
Chamber observation mechanism | Color camera |
Operation computer | Windows ® Desktop PC with touch panel |
Analysis software (Standard) | Qualitative analysis (Automatic, KLM marker, Sum peak display, Spectrum search) Quantitative analysis (Bulk FP method, Calibration curve method) RoHS analysis solution (Cd, Pb,Cr, Br, Hg) Simplified analysis solution Report creation software |
Software for daily check (Standard) | Tube bulb aging, Energy check, Intensity check |
Notices: Windows® is either registered trademarks or trademarks of Microsoft Corporation in the United States and/or other countries.
Major options
- SAMPLE CHAMBER VACCUM UNIT
- AUTO SAMPLE CHANGER
- FILTER SET
- FILTER FP METHOD ANALYSIS SOFTWARE
- THIN FILM FP METHOD ANALYSIS SOFTWARE
- SUM PEAK REMOVAL SOFTWARE
- Ni plating screening solution
- Sn plating screening solution
- Halogen screening solution
Related Products
Information
Installation Examples
