JSX-1000S X-ray fluorescence spectrometer(XRF)

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Features

JSX-1000S X-ray fluorescence spectrometer(XRF)
The JSX-1000S is an X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
 

JSX-1000S in motion


Click the "replay" button in the box above, and the movie will start(for 4 minutes)

Simple Operation

Simply set the sample and touch the screen; that’s how easy it is to operate. Another touch of the screen is all it takes to switch between analysis results and spectrum display. It is as easy to operate as a tablet PC or a smart phone. (Operation using a keyboard and a mouse is also supported.)

Set & Touch simple operation

A simple, intuitive operation GUI

A simple, intuitive operation GUI

High Sensitivity & High Throughput

JEOL’s own SDD (silicon drift detector) and  newly-developed optical system, in combination with filters designed to handle the entire energy range, make it possible to achieve  high-sensitivity analysis.
The sample chamber vacuum unit (option) further increases detection sensitivity for lighter elements. 
JSX-1000S Optical System

Sensitive analysis throughout the entire energy range

High-sensitivity analysis can be performed across the entire energy range using a maximum of 9 types of filters and a sample chamber vacuum unit.
 
* Cl, Cu, Mo and Sb are options

Example: trace element detection (10 ppm or less)

Providing Solutions

With solution based applications, the desired analysis can be executed automatically according to pre-recorded recipes. Simply select the desired solution icon from the solution application list for automated analysis and display of results. Solution applications offer simplified analysis in a wide range of fields.

The new Smart FP (Fundamental Parameter) method makes it possible to obtain highly-accurate quantitative results without the need to prepare a standard sample, and includes automatic correction for thickness and residual ingredient balance.
(The residual balance correction and thickness correction functions are only applicable to organic samples.)

Thickness Crrection Cr Zn Cd Pb Automatic balance
0.5mm No 0.008 0.037 0.001 0.002 99.76
3.8mm 0.012 0.109 0.004 0.006 99.64
0.5mm Yes 0.011 0.137 0.015 0.010 99.54
3.8mm 0.011 0.134 0.016 0.011 99.55
Standard value 0.010 0.125 0.014 0.010
（mass%）

Specifications

Analysis element range Mg～U
F～U (Option)
X-ray generator 5 to 50 kV, 1 mA
Target Rh
Primary filter: 9 types, Automatic exchange Standard：OPEN, ND, Cr, Pb, Cd
Option：Cl, Cu, Mo, Sb
Collimator: 3 types, Automatic exchange 0.9mm, 2mm, 9mm
Detector Silicon drift detector (SDD)
Specimen chamber size 300mm(D)×80mm(H)
Specimen chamber atmosphere AIR / VAC (Option)
Chamber observation mechanism Color camera
Operation computer Windows ®　Desktop PC with touch panel
Analysis software (Standard) Qualitative analysis (Automatic, KLM marker, Sum peak display, Spectrum search)
Quantitative analysis (Bulk FP method, Calibration curve method)
RoHS analysis solution (Cd, Pb,Ｃｒ, Br, Hg)
Simplified analysis solution
Report creation software
Software for daily check (Standard) Tube bulb aging, Energy check, Intensity check

Notices: Windows® is either registered trademarks or trademarks of Microsoft Corporation in the United States and/or other countries.

 

Major options

  • SAMPLE CHAMBER VACCUM UNIT
  • AUTO SAMPLE CHANGER
  • FILTER SET
  • FILTER FP METHOD ANALYSIS SOFTWARE
  • THIN FILM FP METHOD ANALYSIS SOFTWARE
  • SUM PEAK REMOVAL SOFTWARE
  • Ni plating screening solution
  • Sn plating screening solution
  • Halogen screening solution

Application

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