- Related Products
The EDS, which is a versatile and easy-to-use X ray detector, can be mounted. A combined WDS snd EDS system provides a seamless and user-friendly environment for analysis.
JEOL has developed a new EPMA(Electron Probe Microanalyzer), that continues a long history of EPMA development extending over neary a half century. The JXA-8230, designed for user-friendly operations, provides for a complete range of analyses through a new, simple to use, PC-based interface. The high-accuracy and fast speeds offered by the JXA-8230 are a result of its sophisicated hardwre developed from JEOL's EPMA technologies refined over neary 50 years. The JXA-8230 is powerful, next-generation, analytical tool that fully meets all of the requirements of an EPMA.
EPMA quick startClick any point and then an analysis type to start a preset qualitative or quantitative ED or WD analysis
User recipesSave or recall a frequently used set of analytical conditions for a variety of different sample types. All column, EDS and WDS parameters are included in the recipe.
- Digital pulse processor
- Spectral mapping (WD/ED, stage and beam scanning)
- Fan free SDD (option)
|Detectable element range||WDS：(Be)*1 /B～U, EDS：B～U|
|Detectable X-ray range||Detectable wavelength range with WDS : 0.087 to 9.3nm
Detectable energy range with EDS : 20keV
|Number of spectrometers||WDS: Up to 5 selectable, EDS: 1|
|Maximum specimen size||100mm × 100mm × 50mm（H）|
|Accelerating voltage||0.2 to 30kV（0.1kV steps）|
|Probe current range||10-12 to 10-5 A|
|Probe current stability||±0.05%/h, ±0.3%/12h（W）|
|Secondary electron image resolution||6nm（W）, 5nm（LaB6）*2
（W.D. 11mm, 30kV）
|Scanning magnification||×40 to ×300,000（W. D. 11mm）|
|Scanning image resolution||Maximum 5,120× 3,840|
|Color display||For EPMA analysis : LCD 1,280 × 1,024
For SEM operation and EDS analysis : LCD 1,280 × 1,024
*2: LaB6 optional