SightSKY Camera (EM-04500SKY) High sensitivity, Low noise fiber coupling CMOS camera

High resolution TEM image of Si₃N₄

Digital Zoom maintains sharp imaging, even at lattice resolution.

Instrument: JEM-2100Plus
Accelerating voltage: 200 kV

High-resolution TEM image and electron diffraction pattern of
Al₇₂ Fe₂₄ Ni₄ dodecagonal quasi-crystal

Digital Zoom enables observation of atomic arrangements showing quasi-periodicity, such as those characteristic of quasi-crystals.
Moreover, high dynamic range yields excellent electron diffraction pattern contrast, from the high-intensity direct spot to weaker-intensity spots.

Sample courtesy of
Professor Emeritus Kenji Hiraga, Tohoku University
Dr. Kunio Yubuta, Kyushu University

A bright triangle area appearing at upper right of the diffraction pattern is shown by Log display.

Instrument： JEM-2100Plus
Accelerating voltage： 200 kV

TEM images of polycrystalline silicon

Fine structures, such as twin textures of polycrystalline silicon, can be observed with high contrast.

BF-TEM

DF-TEM

Dark field image formed by the diffraction spot highlighted with the yellow circle in the inset.

Instrument： JEM-2100Plus
Accelerating voltage： 200 kV

TEM image of polyethylene (PE) and polypropylene (PP) resin

Digital Zoom enables clear observation of lamella structures.

Sample preparation method: Microtome
Instrument: JEM-2100Plus
Accelerating voltage: 80 kV

TEM image of carrot leaf

Membrane structures of chloroplasts and mitochondria can be identified; furthermore, fine membrane structures can be observed in detail.

Sample preparation method: Microtome
Instrument: JEM-1400Flash
Accelerating voltage: 120 kV

TEM image of phospholipid bilayer (Liposome)

Lipid bilayer membranes of liposome can be clearly distinguished.

Sample preparation method: ice embedding
Instrument: JEM-F200Cryo
Accelerating voltage: 200 kV

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