- Electron Probe Microanalyzer (EPMA)
- miXcroscopy™ Linked Optical & Scanning Electron Microscopy System
miXcroscopy™ Linked Optical & Scanning Electron Microscopy System
- Related Products
Data acquisition and intuitive observation with the use of color
Smooth target search takes advantage of the features of the optical microscope
Prevents damage to the specimen from the electron beam
"miXcroscopy™ for EPMA" -System outline-
"miXcroscopy™ for EPMA" is a system to set EPMA (Electron Probe Microanalyzer) point analysis positions by using an optical microscope (OM).
“miXcroscopy™ for EPMA” improves the EPMA operation and analysis efficiency.
"miXcroscopy™ for EPMA" -Rapid registration of analysis positions -
miXcroscopy™ for EPMA rapidly determines analysis positions for specimens that are difficult to distinguish elements from the backscattered electron image, by installation of polarized light microscope.
Specimen: Mineral thin section
Polarized light OM image: Mag. x50
Backscattered electron image: Mag. x50
"miXcroscopy™ for EPMA" -Precise, fast analysis of OM-registered positions-Specimen: Mineral thin section
miXcroscopy™ for EPMA enables efficient task separation of OM and EPMA. OM searches analysis areas and registers analysis points. EPMA performs elemental analysis. This drastic improvement greatly increases EPMA analysis time.