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Discontinued Products

Transmission Electron Microscope (TEM)

Scanning Electron Microscope (SEM)

Specimen Preparation Equipment (CP)

MultiBeam System (FIB)

Electron Probe Microanalyzer (EPMA)

Auger Microprobe (Auger)

Photoelectron Spectrometer (ESCA)

X-ray Fluorescence Spectrometer (Benchtop)

Scanning Probe Microscope

Others

Nuclear Magnetic Resonance Spectrometer (NMR)

Electron Spin Resonance Spectrometer (ESR)

GC-MS

LC-MS (DART-MS)

MALDI-TOFMS

Defect Review Scanning Electron Microscope (WS)

Electron Beam Lithography System

Thin Film Formation Equipment (E-Beam and Plasma Sources, etc.)

Clinical Chemistry Analyzer (CA)

Amino Acid Analyzer

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DEVELOPMENT /
INSTALLATION CASES

Voices from our users are introduced in the form of interviews, installation cases, and development secrets. You may find some informative hints that can resolve your issue. Please do check them.

Science Basics

Easy explanation about mechanisms and
applications of JEOL products

Contacts

JEOL provides a variety of support services to ensure that our customers can use our products with peace of mind.
Please feel free to contact us.