Basic Research
In the basic science fields that are tackled in universities, laboratories, corporations and other organizations, JEOL’s high-end variety of chemical-structure analysis instruments (many types of electron microscopes, MS and NMR systems, etc.) can contribute to cutting-edge researches that include morphological characterization, element distribution and structural analysis over macro- to nano-regions.
PRODUCT LINEUP
APPLICATIONS NOTES
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Argon Beam Cross Sectioning
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An Appraisal of High Resolution Scanning Electron Microscopy Applied To Porous Materials
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Artifact-free cross-sections
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Precise SEM Cross Section Polishing via Argon Beam Milling
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Preparation of a High Quality Cross Section of a Bone Tissue for SEM
-Application of the Cross-section Polisher to a Biological Specimen-
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A New Specimen Treatment Chamber for XPS and Its Applications
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Analysis of Surface Nano Structure in Angle Resolved Auger-XPS High sensitivity surface analysis using ARXPS
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JPS-9200 Application Data
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XPS for Environmental Studies
Analysis of Hexavalent Chromium in Compliant to WEEE/RoHS
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Analysis of Solid Polymer Electrodes in a Fuel Cell by XPS For Enhanced Durability of Clean Energy Fuel Cells
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Wide Area Auger Mapping
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Auger Image Collection from Defined Areas
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Auger Microprobe JAMP-9500F
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Simple and Easy Chemical Bond Analysis in XPS
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Chemical Status Analysis using AES
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AES Neutralizing Gun (FMIED)
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Combining UHV-SEM and EBSD
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Specimen Preparation Devices for JAMP-7800 Series
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Auger Analysis Scheduling Program
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Information Derived from PGSE-NMR ～Ion Diffusion Behavior, Molecular Association, Molecular Weight / Composition Correlation of Synthetic Polymers～
JEOLnews Volume 46, Number 1,2011
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Analyzing conditions for high spatial resolution X-ray images
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Cathode luminescence in EPMA
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Image Processing Techniques for Mapping
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Beam size and X-ray emitting area
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Auger Analysis of CP Cross Section