Metal

Precise SEM Cross Section Polishing via Argon Beam Milling

Preparation of a High Quality Cross Section of a Bone Tissue for SEM

-Application of the Cross-section Polisher to a Biological Specimen-

JPS-9200 Application Data

Wide Area Auger Mapping

Auger Image Collection from Defined Areas

Auger Microprobe JAMP-9500F

Chemical Status Analysis using AES

AES Neutralizing Gun (FMIED)

Combining UHV-SEM and EBSD

Specimen Preparation Devices for JAMP-7800 Series

Auger Analysis Scheduling Program

Analyzing conditions for high spatial resolution X-ray images

Auger Analysis of CP Cross Section

Study of Nanoparticles at UTSA: One Year of Using the First JEM-ARM200F Installed in USA

JEOLnews Volume 46, Number 1,2011

Development of JEM-2800 High Throughput Electron Microscope

JEOLnews Volume 46, Number 1,2011

Cross-sectioning of urethane rubber by an Ar broad ion beam for SEM imaging

ESR of Material－Carbon

ER110001E

Preparation of High Quality Cross Section of Bone Tissue for SEM：Application of Cross-section Polisher to Biological Specimen

High-power Electron Beam Source used for Melting Metal Materials ：Vacuum melting furnace for polycrystalline silicon refinement

JEOLnews Volume 43, Number 1, 2008

Rapid Characterization of Bacteria Using ClairScope and SpiralTOF

JEOLnews Volume 45, Number 1, 2010

JEM-2100: Applications in Nanotechnology

JEOLnews Volume 45, Number 1, 2010

Lithium Atom Microscopy at Sub-50pm Resolution by R005

JEOLnews Volume 45, Number 1, 2010

Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM

JEOLnews Volume 45, Number 1, 2010

Ultrahigh-Resolution STEM Analysis of Complex Compounds

JEOLnews Volume 45, Number 1, 2010

Very fast MAS up to 80kHz!

NM100001E