Metal

AES Neutralizing Gun (FMIED)

Combining UHV-SEM and EBSD

Specimen Preparation Devices for JAMP-7800 Series

Auger Analysis Scheduling Program

Analyzing conditions for high spatial resolution X-ray images

Auger Analysis of CP Cross Section

Study of Nanoparticles at UTSA: One Year of Using the First JEM-ARM200F Installed in USA

JEOLnews Volume 46, Number 1,2011

Development of JEM-2800 High Throughput Electron Microscope

JEOLnews Volume 46, Number 1,2011

Cross-sectioning of urethane rubber by an Ar broad ion beam for SEM imaging

ESR of Material－Carbon

ER110001E

Preparation of High Quality Cross Section of Bone Tissue for SEM：Application of Cross-section Polisher to Biological Specimen

High-power Electron Beam Source used for Melting Metal Materials ：Vacuum melting furnace for polycrystalline silicon refinement

JEOLnews Volume 43, Number 1, 2008

Rapid Characterization of Bacteria Using ClairScope and SpiralTOF

JEOLnews Volume 45, Number 1, 2010

JEM-2100: Applications in Nanotechnology

JEOLnews Volume 45, Number 1, 2010

Lithium Atom Microscopy at Sub-50pm Resolution by R005

JEOLnews Volume 45, Number 1, 2010

Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM

JEOLnews Volume 45, Number 1, 2010

Ultrahigh-Resolution STEM Analysis of Complex Compounds

JEOLnews Volume 45, Number 1, 2010

Very fast MAS up to 80kHz!

NM100001E

Measurement of Polymer Intermediates by Time Resolved ESR II

ER100001E

STMAS probe ～to analyze low-sensitivity half-integer spin nuclei in solid-state high-resolution NMR spectroscopy～

NM090002E

JXA-8230 Electron Probe Micro Analyzer

JXA-8530F Field Emission Electron Probe Microanalyzer

A PC Controlled, WD/ED Combined System Opens Doors to New Ultra Micro Analysis

High Sensitivity Measurement of a Copper Complex by ESR

ER080004E

Very Low Temperature Measurement - Liquid He Unit ES-CT470

ER080003E

ESR Dating - No. 2

ER080002E