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Transmission Electron Microscopes
Transmission Electron Microscope (TEM)
Magnetic Resonance Equipment
Nuclear Magnetic Resonance
Spectrometer (NMR)
Electron Spin Resonance
Spectrometer (ESR)
Semiconductor Equipment
Electron Beam Lithography System (EB)
Scanning Electron Microscopes
Scanning Electron Microscope (SEM)
Industrial Equipment for thin-film formation and material processing
Thin Film Formation Equipment
(E-Beam and Plasma Sources, etc.)
Material Processing Equipment
(For Metal Melting and Nanopowder Synthesis, etc.)
Ion Beam Application Equipment
Specimen Preparation Equipment
MultiBeam System (SEM-FIB)
X-ray Fluorescence Spectrometers
X-ray Fluorescence Spectrometer (XRF)
Clinical Chemistry Analyzers
Clinical Chemistry Analyzer (CA)
Instruments for Microarea and Surface Analysis
Electron Probe Microanalyzer (EPMA)
Auger Microprobe (Auger)
Photoelectron Spectrometer (ESCA)
Mass Spectrometers
GC-MS、Gas Analysis MS
LC-MS(DART-MS)、MALDI-TOFMS
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PRODUCT LINEUP
Transmission Electron Microscope (TEM)
Scanning Electron Microscope (SEM)
Specimen Preparation Equipment
Electron Probe Microanalyzer (EPMA)
Auger Microprobe (Auger)
Photoelectron Spectrometer (ESCA)
MultiBeam System (FIB)
Nuclear Magnetic Resonance Spectrometer
Electron Spin Resonance Spectrometer
Mass Spectrometer
APPLICATIONS NOTES
multiple region selective HMQC
NM050016E
C5FH/FG2 probe
NM050015E
ZQC suppression sequence
NM050012E
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Discontinued Products
Glossary of TEM Terms
Glossary of SEM Terms
