Semiconductor and Electronic Parts
In the semiconductors field, JEOL Electron Beam Lithography Systems, SEMs, FIB (SEM)s, and TEMs are utilized in the processes of pattern generation, monitoring, defect analysis and packaging. Also for various electronic parts, our SEMs, FIB (SEM)s and TEMs are used.
PRODUCT LINEUP
APPLICATIONS NOTES
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JEOL NEWS Vol.53
JEOL NEWS Vol.53/ July 2018
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ESR of Materials -Electrically Detected Magnetic Resonance 1-
ER170007
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ESR of Materials - Semiconductor 1-
ER170006
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Development of the JBX-8100FS Electron Beam Lithography System
JEOL NEWS Vol.53 No.10
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Structural Analysis of Semiconductor Devices by Using STEM/EDS Tomography
JEOL NEWS Vol.53 No.7
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Ionization Methods for JEOL Mass Spectrometers -A Guidebook-
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Gas analysis
Gas analysis solutions with JEOL Mass Spectrometers
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GC-TOFMS Application: Thermal decomposition analysis of antioxidant additive by TG-MS ーAccurate mass measurement with TG-TOFMS systemー
MSTips No.250
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GC-TOFMS Application: Fluorocarbon polymers analysis by TG-MS ーHigh m/z range measurement using TG-TOFMS systemー
MSTips No.249
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New extended VT HXMAS probe
NM160008E
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Low Frequency Unit for solid NMR probe
NM150010E
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Studies of minute quantities of natural abundance molecules using 2D heteronuclear correlation spectroscopy under 100 kHz MAS: CP-HSQC approach
NM150009E
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New TFH triple resonance probe
NM150002E
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120 kHz MAS: unprecedentedly fast spinning speed
NM150001E
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Single-Tuned 4mm Cryocoil MAS Probe
NM140018E
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Quantitative NMR Using Large-volume 8mm MAS Probe:PASS Technique Overcomes Sample-spinning Limitation
NM140008E
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How to Set the Flip Angle to Maximize the Sensitivity per Hour: Meaning of Ernst Angle
NM130017E
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How to Set the Recycle Delay to Maximize the Sensitivity per Hour: Most Efficient Measurements
NM130016E
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The Effects of 1H Decoupling Strength on 13C MAS Spectral Resolution for Solid Polymer Samples
NM130015E
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Do You Wanna See 2D Results on the Way ? Delta NMR software Has "outer scans" Function !
NM130014E
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Delta NMR software for quantitative NMR analysis
NM130012E
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29Si NMR measurement using silicon free probe
NM130006E
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Sensitivity enhancement of half-integer quadrupolar nuclei: QCPMG
NM130001E
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Scanning Electron Microscope A To Z
Basic Knowledge For Using The SEM
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High Resolution Imaging and Spectroscopy Using CS-corrected TEM with Cold FEG JEM-ARM200F
JEOLnews Volume 47, Number 1, 2012