Suitable for observation and analysis of a variety of specimens
– High vacuum mode provides higher quality measurements! -

The JCM-7000 is equipped with a high vacuum mode for observation and analysis of conductive specimens and low vacuum mode for observation and analysis of conductive specimens with no specimen treatment.
Therefore, the JCM-7000 can be used for SEM observation and EDS analysis of a diverse range of specimens.

◆Click the "replay" button in the box above, and the movie will start (for 2 minutes)◆