Find Product:Keyword

157matches for

• 
  JBX-8100FS Series Electron Beam Lithography System
• 
  BS-60060DEBS Electron Beam Source
• 
  BS-72050ICE Electron Beam Power Supply
• 
  BS/JEBG/EBG series Electron Beam Source
• 
  IB-19520CCP Cross Section Polisher
• 
  IB-19530CP CROSS SECTION POLISHER
• 
  JAMP-9510F Field Emission Auger Microprobe
• 
  JBX-6300FS Electron Beam Lithography System
• 
  JEBG series High-power electron beam sources
• 
  JES-X3 Series ESR
• 
  JIB-4700F Multi Beam System
• 
  Gas Analysis: JMS-MT3010HRGA INFITOF Multi-Turn Time-of-Flight Mass Spectrometer
• 
  MALDI: JMS-S3000 Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometer
• 
  GC-MS : JMS-TQ4000GC GC Triple Quadrupole Mass Spectrometer
• 
  JNM-ECZR series FT NMR
• 
  JPS-9030 Photoelectron Spectrometer
• 
  JSM-7900F Schottky Field Emission Scanning Electron Microscope
• 
  JSX-1000S X-ray fluorescence spectrometer(XRF)
• 
  JXA-8530FPlus Field Emission Electron Probe Microanalyzer
• 
  MICCS（MIcro Channeled Cell for Synthesis monitoring）
• 
  Insertion type dewar
• 
  400 MHz Year Hold Magnet (400JJYH)
• 
  Zero Boil Off Magnet
• 
  Automated Solid State NMR System －A solid NMR probe with the throughput of a liquid NMR probe－
• 
  BS-60211DEM/BS-60210DEM Electron Beam Source
• 
  BS-64010SCT Scan Controller
• 
  BS-EBM series Multipurpose Electron Beam Melting Furnace
• 
  Variable temperature controller　DVT5
• 
  JBX-9500FS Electron Beam Lithography System
• 
  JEM-ARM300F GRAND ARM Atomic Resolution Electron Microscope
• 
  GC-MS: JMS-T200GC AccuTOF™ GCx-plus High Performance Gas Chromatograph – Time-of-Flight Mass Spectrometer
• 
  JNM-ECZS series FT NMR
• 
  JSM-7800FPRIME Schottky Field Emission Scanning Electron Microscope
• 
  JXA-8230 Electron Probe Microanalyzer
• 
  Novel 30/64/100 slots auto sample changer (ASC30/64/100)
• 
  Superconducting magnets (SCM)
• 
  PreCool ASC30 (A 30 slot auto sample changer with sample cooling)
• 
  400°CVT　DVT400
• 
  JBX-3200MV Electron Beam Lithography System
• 
  JEM-Z300FSC (CRYO ARM™ 300) Field Emission Cryo-Electron Microscope