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162
matches for
JMS-T2000GC AccuTOF™ GC-Alpha High Performance Gas Chromatograph - Time-of-Flight Mass Spectrometer
Automated Solid State NMR System -A solid NMR probe with the throughput of a liquid NMR probe-
BS-60060DEBS Electron Beam Source
BS-72050ICE Electron Beam Power Supply
BS/JEBG/EBG series Electron Beam Source
IB-10500HMS CROSS SECTION POLISHER™ High Throughput Milling system
JAMP-9510F Field Emission Auger Microprobe
JBX-8100FS Series Electron Beam Lithography System
BioMajesty™ ZERO series JCA-ZS050
JEBG series High-power electron beam sources
CRYO ARM™ 300 II (JEM-3300) Field Emission Cryo-Electron Microscope
JES-X3 Series ESR
JIB-4000PLUS Focused Ion Beam Milling & Imaging System
JIB-4700F Multi Beam System
Gas Analysis: JMS-MT3010HRGA INFITOF Multi-Turn Time-of-Flight Mass Spectrometer
GC-MS : JMS-TQ4000GC GC Triple Quadrupole Mass Spectrometer
JNM-ECZR series FT NMR
JPS-9030 Photoelectron Spectrometer
JSM-7900F Schottky Field Emission Scanning Electron Microscope
JSM-IT800 Field Emission Scanning Electron Microscope
JSX-1000S X-ray fluorescence spectrometer(XRF)
JXA-iHP200F Field Emission Electron Probe Microanalyzer (FE-EPMA)
Novel 30/64/100 slots auto sample changer (ASC30/64/100)
400 MHz Year Hold Magnet (400JJYH)
BS-60610BDS Bombardment Deposition Source
BS-64010SCT Scan Controller
Variable temperature controller DVT5
IB-19520CCP CROSS SECTION POLISHER™
JBX-6300FS Electron Beam Lithography System
JBX-9500FS Electron Beam Lithography System
CRYO ARM™ 300 (JEM-Z300FSC) Field Emission Cryo-Electron Microscope
GC-MS: JMS-T200GC AccuTOF™ GCx-plus High Performance Gas Chromatograph – Time-of-Flight Mass Spectrometer
JNM-ECZS series FT NMR
JXA-iSP100 Electron Probe Microanalyzer (EPMA)
Superconducting magnets (SCM)
PreCool ASC30 (A 30 slot auto sample changer with sample cooling)
MALDI: JMS-S3000 SpiralTOF™-plus Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometer
24 slots auto sample changer (ASC24)
BS-60250DEM Electron Beam Source
400°CVT DVT400
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