Specimen Preparation Equipment List

IB-19520CCP Cross Section Polisher

Thermal damage can be reduced by cooling the specimen with liquid nitrogen during processing.
Designed to suppress the consumption of liquid nitrogen, allowing long cooling periods.
Rapid cooling of the specimen while immersed in liquid nitrogen. Return to room temperature. Designed to allow parts to be detached.
Incorporates a mechanism to allow the process from polishing to observation to be performed with exposing the sample to the air.

IB-19510CP Cross Section Polisher

New high-speed and fine milling modes achieve even higher throughput of high-quality cross sections.
Intermittent milling mode is standard, simplifying the handling of specimens susceptible to heat damage.
Improvements to facilitate processing of a wide range of materials include:

IB-19500CP Cross Section Polisher

New high-speed and fine milling modes achieves even higher throughput of high-quality cross sections.
Intermittent milling mode is standard, simplifying the handling of specimens susceptible to heat damage.
Improvements to facilitate processing of a wide range of materials include:

EM-09100IS Ion Slicer™

Innovative Specimen Preparation Method for TEM / STEM / SEM / EPMA / AUGER

IB-09060CIS Cryo Ion Slicer™

For easy preparation of TEM thin film samples of heat sensitive materials

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