Scanning Electron Microscope (SEM) List
JSM-7800FPRIME delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
The newly-developed Super Hybrid Lens (SHL) is used to achieve the next-generation high-resolution SEM, without sacrificing operability. The adoption of the Schottky type electron gun delivers stable analysis with large probe current.
JSM-7610F is an ultra high resolution Schottky Field Emission Scanning Electron Microscope which has semi-in-lens objective lens. High power optics can provide high throughput and high performance analysis. It’s also suitable for high spatial resolution analysis. Furthermore, Gentle Beam mode can reduce the incident electron penetration to the specimen, enabling you to observe its topmost surface by using a few hundred landing energy.
A field emission SEM with a semi-in-lens and equipped with a Gentle Beam to deliver high-resolution. Of course, a variety of options can be installed, including element analysis.
JSM-7200F has much higher spatial resolution than the conventional models at both high and low accelerating voltages by applying the technology used for “In-Lens SchottkyPlus”, the electron optics equipped on our flagship-model, JSM-7800FPRIME, and by incorporating TTLS (Through-The-Lens System). The maximum probe current of 300 nA is also guaranteed because of the above mentioned features. Thus, JSM-7200F is a next-generation multi-purpose FE-SEM that has capability of high resolution observation, high throughput analysis, ease of use, and expandability.
In addition to the high image quality observation due to the improvement of the illuminating system, the vacuum system and the signal processing system, the JSM-IT300 is a Scanning Electron Microscope, which can be operated with a high throughput by using touch panel operation and the high speed stage.
The JSM-IT300HR is a new model of JEOL InTouchScope Series.
Equipped with a new high-brightness electron gun and optical system, the JSM-IT300HR achieves superbly high-quality imaging and analysis with high sensitivity and high spatial-resolution.
This new cutting-edge SEM provides superb performance while maintaining high operability building on the award-winning InTouchScope Series.
The JSM-IT100, equipped with 50 years of JEOL SEM technologies, is a compact, versatile scanning electron microscope. Ease of use is a key feature of our successful InTouchScope series while maintaining the versatility and expandability expected from a research-grade SEM. This all-in-one SEM is used in a wide range of fields, such as biotechnology and nanotechnology, covering various applications, from materials development, testing, evaluation, and defect analysis to quality control, etc.
Benchtop Scanning Electron Microscope. Intuitive operation is achieved via touch panel and new operation screens. The low vacuum mode is included in the standard configuration, and EDS can be installed, offering a truly multi-functional benchtop SEM
The Analysis Station is an SEM/EDS integration system which has been developed under the concept of "a fusion of image observation and analysis". Using the SEM's motor driven stage enables wide area observation and analysis.
The Soft X-Ray Emission Spectrometer (SXES) is an ultra-high resolution spectrometer consisting of a newly-developed diffraction grating and a high-sensitivity X-ray CCD camera.
In the same way as EDS, parallel detection is possible, and 0.3 eV (Fermi-edge, Al-L standard) ultra-high energy resolution analysis can be performed, surpassing the energy resolution of WDS.
The same specimen holder can now be used for both the optical microscope and the scanning electron microscope. As a result, by managing the stage information with dedicated software, it is possible for the system to record the locations observed with the optical microscope, and then further magnify the same areas with the scanning electron microscope to observe the fine structures at higher magnification & higher resolution.The observation targets found with the optical microscope can be seamlessly observed with the scanning electron microscope without having to search for the target again. It is now possible to smoothly and easily compare and verify the optical microscope images and scanning electron microscope images.
The 3View®2XP (Gatan Inc.) is incorporated into the Schottky field emission scanning electron microscope that can produce fine electron probe at a high current over long periods of time, making it possible to automatically create cross sections of the specimen and obtain images. The 3D reconstruction of the acquired images enables detailed analysis of the fine structures in three dimensions.