Transmission Electron Microscope (TEM) List

JEM-1000 Ultra-High Voltage Electron Microscope

JEM-1000 is the ultra-high voltage (accelerating voltage: 1,000 kV) transmission electron microscope among those used in universities and research institutes worldwide.

JEM-ARM300F GRAND ARM Atomic Resolution Electron Microscope

JEM-ARM300F GRAND ARM is an Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.

JEM-ARM200F ACCELARM Atomic Resolution Analytical Electron Microscope

JEM-ARM200F ACCELARM is an Atomic Resolution Analytical Electron Microscope, which boasts an unprecedented STEM-HAADF resolution of 78 pm with a STEM Cs corrector incorporated as standard.

JEM-3200FS Field Emission Energy Filter Electron Microscope

The JEM-3200FS Field Emission Electron Microscope is equipped with a field emission electron gun of 300 kV accelerating voltage and an in-column energy filter which shows high performance. This electron microscope offers solutions for various biological and materials researches.

JEM-F200 Multi-purpose Electron Microscope

JEM-F200 is a new field emission transmission electron microscope, which features higher spatial resolution and analytical performance, an easy to use new operation system for multi-purpose operation, a smart appearance, and various environmentally friendly, energy saving system.

JEM-2800 High Throughput Electron Microscope

JEM-2800 is a versatile TEM/STEM that offers superior usability, while simultaneously achieving high-resolution, high throughput and highly sensitive analysis.

JEM-2200FS Field Emission Electron Microscope

The JEM-2200FS, a state-of-the art analytical electron microscope, is equipped with a 200kV field emission gun (FEG) and the in-column energy filter (Omega filter) that allows a zero-loss image, where inelastic electrons is eliminated, resulting in clear images with high contrast. And energy-filtered images forming with electrons at low loss or core loss energy provide chemical state or elemental information of a sample. Also, spectroscopy for elemental analysis and chemical analysis of specimens is available.

JEM-2100F Field Emission Electron Microscope

The JEM-2100F is a multipurpose, 200 kV FE (Field Emission) analytical electron microscope. Variety of versions is provided to adapt user’s purposes. The FE electron gun (FEG) produces highly stable and bright electron probe that is never achieved with conventional thermionic electron gun. This feature is essential for ultrahigh resolution in scanning transmission microscopy and in an analysis of a nano-scaled sample. Various analytical instruments and/or cameras such as EDS (Energy Dispersive X-ray Spectrometer) or EELS (electron energy loss spectrometer) or CCD cameras are ready for integration with a PC system of the microscope control.

JEM-2100Plus Electron Microscope

The JEM-2100Plus is a multi purpose transmission electron microscope, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior performance through intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to medical/biological studies.

JEM-1400Plus Electron Microscope

The JEM-1400Plus is a transmission electron microscope (TEM) developed for application in a wide range of disciplines, from biology to materials researches, such as biological sections, polymers, nanomaterials and …. New environment is optimized for ease-of -use TEM operations with followings.

JED-2300T Energy Dispersive X-ray Spectrometer

AnalysisStation JED-2300T is an integration system of TEM/EDS based on a concept of “Image and Analysis”. Data management is carried out by automatically collecting the parameters such as magnification and accelerating voltage along with analysis data.

EM-05500TGP TEM Tomograph System

3-dimensional Structure with high precision TEM Tomograph System is an automation system handling an entire process from an acquisition of sequential tilt images through to their 3-dimensional reconstruction. Its software (Recorder, Composer, Visualizer-Kai) employ unique algorithms for enabling the automation of various adjustments particularly required to Tomography.

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