Correlative Light and Electron Microscopy note
CLEM is an acronym for Correlative Light and Electron Microscopy.
It is one of the most effective analysis methods that provides a synergetic effect by combining the capabilities of the Light Microscope (LM), Transmission Electron Microscope (TEM) and Scanning Electron Microscope (SEM) in observing the same specimen.
LinkJEOL-Nikon CLEM Solution Center
- Please see the PDF file for the additional information.
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