The Relationship between Crystal Condition and Mass Resolving Power, Mass Accuracy

The JMS-S3000 SpiralTOFTM has a unique 17 m flight path that offers the highest resolution MALDI-TOF MS system currently available. With an extended flight distance, the SpiralTOF reduces topographic effect of matrix crystal to a minimum and achieves highly reproducible mass resolving power and high mass accuracy with external mass calibration. In this work, we demonstrate the measurement of a polymer standard with 4 types of matrices that are typically used for MALDI polymer measurement by using the JEOL SpiralTOF system. Additionally, we looked at the crystal condition using the JEOL JSM-7600F thermal field emission scanning electron microscope (FE-SEM).

Please see the PDF file for the additional information.
Another window opens when you click.

PDF 3.5MB