Catalogue Download
You can download each catalogue of JEOL products, in the pdf format.
When you click the front cover of the brochure you want to download, the relevant pdf document appears.
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- Transmission Electron Microscope (TEM)
- Scanning Electron Microscope (SEM)
- Ion Beam Application Equipment (FIB、IS、CP)
- Instruments for Microarea and Surface Analysis (EPMA、Auger、XPS、ESCA)
- Nuclear Magnetic Resonance Spectrometer (NMR)
- Electron Spin Resonance Spectrometer (ESR)
- X-ray Fluorescence Spectrometer (XRF)
- Mass Spectrometer (MALDI-TOFMS、GC-MS、LC-MS)
- Semiconductor Equipment
- Industrial Equipment for thin-film formation and material processing
Product Guide
Transmission Electron Microscope (TEM)
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JEM-Z300FSC (CRYO ARM™ 300) Field Emission Cryo-Electron Microscope
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JEM-Z200FSC (CRYO ARM™ 200) Field Emission Cryo-Electron Microscope
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JEM-ARM300F GRAND ARM™ Atomic Resolution Electron Microscope
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JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope
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Monochromated JEM-ARM200F Atomic Resolution Analytical Electron Microscope
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JEM-F200 Multi-purpose Electron Microscope
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JEM-3200FS Field Emission Energy Filter Electron Microscope
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JEM-2200FS Field Emission Electron Microscope
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JEM-2100Plus Electron Microscope
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JEM-1400Flash Electron Microscope
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SAAF Octa Segmented Annular All Field Detector Octa
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4DCanvas™ Pixelated STEM Detector
Scanning Electron Microscope (SEM)
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JSM-7900F Schottky Field Emission Scanning Electron Microscope
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JSM-7610FPlus Schottky Field Emission Scanning Electron Microscope
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JSM-7200F Schottky Field Emission Scanning Electron Microscope
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JSM-F100 Schottky Field Emission Scanning Electron Microscope
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JSM-IT500HR InTouchScope™ Scanning Electron Microscope
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JSM-IT500 InTouchScope™ Scanning Electron Microscope
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JSM-IT200 InTouchScope™ Scanning Electron Microscope
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JCM-6000Plus NeoScope™ Versatile Benchtop SEM
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JCM-7000 NeoScope™ Versatile Benchtop SEM
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JCM-7000 NeoScope™ Versatile Benchtop SEM
Ion Beam Application Equipment (FIB、IS、CP)
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JIB-4700F Multi Beam System
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JIB-4000PLUS Focused Ion Beam Milling & Imaging System
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IB-19520CCP CROSS SECTION POLISHER
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IB-19530CP CROSS SECTION POLISHER™
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CROSS SECTION POLISHER™ Precise Positioning Microscope
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CROSS SECTION POLISHER™ Precise Positioning Microscope TYPE2
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EM-09100IS Ion Slicer™
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IB-09060CIS Cryo Ion Slicer™
Instruments for Microarea and Surface Analysis (EPMA、Auger、XPS、ESCA)
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JXA-iHP200F Schottky field emission Electron Probe Microanalyzer
JXA-iSP100 Tungsten/LaB6 Electron Probe Microanalyzer -
JXA-8530FPlus Field Emission Electron Probe Microanalyzer (FE-EPMA)
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JXA-8230 Electron Probe Microanalyzer (EPMA)
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SS-94000SXES/SS-94040SXSER Super Spectrometer
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JAMP-9510F Field Emission Auger Microprobe
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JPS-9030 Photoelectron Spectrometer (XPS)
Nuclear Magnetic Resonance Spectrometer(NMR)
Electron Spin Resonance Spectrometer (ESR)
X-ray Fluorescence Spectrometer (XRF)
Mass Spectrometer(MS)
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JMS-MT3010HRGA INFITOF Multi-Turn Time-of-Flight Mass Spectrometer
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JMS-S3000 SpiralTOF™-plus Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometer
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msRepeatFinder Polymer Analysis Software
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JMS-T200GC AccuTOF™ GCx-plus High Performance Gas Chromatograph – Time-of-Flight Mass Spectrometer
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msFineAnalysis Auto analysis software
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JMS-T200GC AccuTOF™ GCx-plus Petroleum and Petrochemical Solutions
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JMS-TQ4000GC GC Triple Quadrupole Mass Spectrometer
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JMS-Q1500GC Master-Quad GC/MS
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MS-T100LP AccuTOF™ LC-plus 4G Atmospheric Pressure Ionization High Resolution Time-of-Flight Mass Spectrometer
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JMS-700 MStation Mass Spectrometer
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JMS-800D High-Resolution Mass Spectrometer
Semiconductor Equipment
Industrial Equipment for thin-film formation and material processing
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