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  • Catalogue Download

Catalogue Download

You can download each catalogue of JEOL products, in the pdf format.
When you click the front cover of the brochure you want to download, the relevant pdf document appears.
Please note that there may exist a longer downloading time of the pdf format brochure, depending on the time when many people access the Internet.

  • Transmission Electron Microscope (TEM)
  • Scanning Electron Microscope (SEM)
  • Ion Beam Application Equipment (FIB、IS、CP)
  • Instruments for Microarea and Surface Analysis (EPMA、Auger、XPS、ESCA)
  • Nuclear Magnetic Resonance Spectrometer (NMR)
  • Electron Spin Resonance Spectrometer (ESR)
  • X-ray Fluorescence Spectrometer (XRF)
  • Mass Spectrometer (MALDI-TOFMS、GC-MS、LC-MS)
  • Semiconductor Equipment
  • Industrial Equipment for thin-film formation and material processing

Product Guide

  • Product Guide
    Product Guide

Transmission Electron Microscope (TEM)

  • JEM-Z300FSC (CRYO ARM™ 300) Field Emission Cryo-Electron Microscope
    JEM-Z300FSC (CRYO ARM™ 300) Field Emission Cryo-Electron Microscope
  • JEM-Z200FSC (CRYO ARM™ 200) Field Emission Cryo-Electron Microscope
    JEM-Z200FSC (CRYO ARM™ 200) Field Emission Cryo-Electron Microscope
  • JEM-ARM300F GRAND ARM™ Atomic Resolution Electron Microscope
    JEM-ARM300F GRAND ARM™ Atomic Resolution Electron Microscope
  • JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope
    JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope
  • Monochromated JEM-ARM200F Atomic Resolution Analytical Electron Microscope
    Monochromated JEM-ARM200F Atomic Resolution Analytical Electron Microscope
  • JEM-F200 Multi-purpose Electron Microscope
    JEM-F200 Multi-purpose Electron Microscope
  • JEM-3200FS Field Emission Energy Filter Electron Microscope
    JEM-3200FS Field Emission Energy Filter Electron Microscope
  • JEM-2200FS Field Emission Electron Microscope
    JEM-2200FS Field Emission Electron Microscope
  • JEM-2100Plus Electron Microscope
    JEM-2100Plus Electron Microscope
  • JEM-1400Flash Electron Microscope
    JEM-1400Flash Electron Microscope
  • SAAF Octa Segmented Annular All Field Detector Octa
    SAAF Octa Segmented Annular All Field Detector Octa
  • 4DCanvas(TM) Pixelated STEM Detector
    4DCanvas™ Pixelated STEM Detector

Scanning Electron Microscope (SEM)

  • JSM-7900F Schottky Field Emission Scanning Electron Microscope
    JSM-7900F Schottky Field Emission Scanning Electron Microscope
  • JSM-7610FPlus Schottky Field Emission Scanning Electron Microscope
    JSM-7610FPlus Schottky Field Emission Scanning Electron Microscope
  • JSM-7200F Schottky Field Emission Scanning Electron Microscope
    JSM-7200F Schottky Field Emission Scanning Electron Microscope
  • JSM-F100 Schottky Field Emission Scanning Electron Microscope
    JSM-F100 Schottky Field Emission Scanning Electron Microscope
  • JSM-IT500HR InTouchScope(TM) Scanning Electron Microscope
    JSM-IT500HR InTouchScope™ Scanning Electron Microscope
  • JSM-IT500 InTouchScope(TM) Scanning Electron Microscope
    JSM-IT500 InTouchScope™ Scanning Electron Microscope
  • JSM-IT200 InTouchScope(TM) Scanning Electron Microscope
    JSM-IT200 InTouchScope™ Scanning Electron Microscope
  • JCM-6000Plus NeoScope(TM) Versatile Benchtop SEM
    JCM-6000Plus NeoScope™ Versatile Benchtop SEM
  • JCM-7000 NeoScope(TM) Versatile Benchtop SEM
    JCM-7000 NeoScope™ Versatile Benchtop SEM
  • JCM-7000 NeoScope(TM) Versatile Benchtop SEM
    JCM-7000 NeoScope™ Versatile Benchtop SEM

Ion Beam Application Equipment (FIB、IS、CP)

  • JIB-4700F Multi Beam System
    JIB-4700F Multi Beam System
  • JIB-4000PLUS
    JIB-4000PLUS Focused Ion Beam Milling & Imaging System
  • IB-19520CCP CROSS SECTION POLISHER(TM)
    IB-19520CCP CROSS SECTION POLISHER
  • IB-19530CP CROSS SECTION POLISHER(TM)
    IB-19530CP CROSS SECTION POLISHER™
  • CROSS SECTION POLISHER(TM) Precise Positioning Microscope
    CROSS SECTION POLISHER™ Precise Positioning Microscope
  • CROSS SECTION POLISHER(TM) Precise Positioning Microscope TYPE2
    CROSS SECTION POLISHER™ Precise Positioning Microscope TYPE2
  • EM-09100IS Ion Slicer(TM)
    EM-09100IS Ion Slicer™
  • IB-09060CIS Cryo Ion Slicer(TM)
    IB-09060CIS Cryo Ion Slicer™

Instruments for Microarea and Surface Analysis (EPMA、Auger、XPS、ESCA)

  • JXA-iHP200F Schottky field emission Electron Probe Microanalyzer  and JXA-iSP100 Tungsten/LaB6 Electron Probe Microanalyzer
    JXA-iHP200F Schottky field emission Electron Probe Microanalyzer
    JXA-iSP100 Tungsten/LaB6 Electron Probe Microanalyzer
  • JXA-8530FPlus Field Emission Electron Probe Microanalyzer(FE-EPMA)
    JXA-8530FPlus Field Emission Electron Probe Microanalyzer (FE-EPMA)
  • JXA-8230 Electron Probe Microanalyzer (EPMA)
    JXA-8230 Electron Probe Microanalyzer (EPMA)
  • SS-94000SXES/SS-94040SXSER Super Spectrometer
    SS-94000SXES/SS-94040SXSER Super Spectrometer
  • JAMP-9510F Field Emission Auger Microprobe
    JAMP-9510F Field Emission Auger Microprobe
  • JPS-9030 Photoelectron Spectrometer (XPS)
    JPS-9030 Photoelectron Spectrometer (XPS)

Nuclear Magnetic Resonance Spectrometer(NMR)

  • JNM-ECZR series FT NMR
    JNM-ECZR series FT NMR
  • JNM-ECZS series FT NMR
    JNM-ECZS series FT NMR

Electron Spin Resonance Spectrometer (ESR)

  • JES-X3 Series ESR
    JES-X3 Series ESR

X-ray Fluorescence Spectrometer (XRF)

  • JSX-1000S X-ray fluorescence spectrometer (XRF)
    JSX-1000S X-ray fluorescence spectrometer (XRF)

Mass Spectrometer(MS)

  • JMS-MT3010HRGA INFITOF Multi-Turn Time-of-Flight Mass Spectrometer
    JMS-MT3010HRGA INFITOF Multi-Turn Time-of-Flight Mass Spectrometer
  • JMS-S3000 SpiralTOF™-plus Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometer
    JMS-S3000 SpiralTOF™-plus Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometer
  • msRepeatFinder Polymer Analysis Software
    msRepeatFinder Polymer Analysis Software
  • JMS-T200GC AccuTOF(TM) GCx-plus High Performance Gas Chromatograph – Time-of-Flight Mass Spectrometer
    JMS-T200GC AccuTOF™ GCx-plus High Performance Gas Chromatograph – Time-of-Flight Mass Spectrometer
  • msFineAnalysis
    msFineAnalysis Auto analysis software
  • Petroleum and Petrochemical Solutions
    JMS-T200GC AccuTOF™ GCx-plus Petroleum and Petrochemical Solutions
  • JMS-TQ4000GC GC Triple Quadrupole Mass Spectrometer
    JMS-TQ4000GC GC Triple Quadrupole Mass Spectrometer
  • JMS-Q1500GC Master-Quad GC/MS
    JMS-Q1500GC Master-Quad GC/MS
  • MS-T100LP AccuTOF(TM) LC-plus 4G Atmospheric Pressure Ionization High Resolution Time-of-Flight Mass Spectrometer
    MS-T100LP AccuTOF™ LC-plus 4G Atmospheric Pressure Ionization High Resolution Time-of-Flight Mass Spectrometer
  • JMS-700 MStation Mass Spectrometer
    JMS-700 MStation Mass Spectrometer
  • JMS-800D High-Resolution Mass Spectrometer
    JMS-800D High-Resolution Mass Spectrometer

Semiconductor Equipment

  • JBX-8100FS Series Electron Beam Lithography System
    JBX-8100FS Series Electron Beam Lithography System
  • JBX-9500FS Electron Beam Lithography System
    JBX-9500FS Electron Beam Lithography System

Industrial Equipment for thin-film formation and material processing

  • JEBG BS-60/JST BS-ICE Series Electron Beam Sources and Power Supplies
    JEBG BS-60/JST BS-ICE Series Electron Beam Sources and Power Supplies
  • BS/EBG/JEBG/JST series Electron Beam Sources and Power Supplies for vacuum deposition
    BS/EBG/JEBG/JST series Electron Beam Sources and Power Supplies for vacuum deposition
  • RF Induction Thermal Plasma System
    RF Induction Thermal Plasma System
  • TP-400020NPS Thermal Plasma Nanopowder Synthesis System
    TP-400020NPS Thermal Plasma Nanopowder Synthesis System

To read a pdf format document, Adobe Reader (version 7.0 or higher recommended).

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