Catalogue Download
You can download each catalogue of JEOL products, in the pdf format.
When you click the front cover of the brochure you want to download, the relevant pdf document appears.
Please note that there may exist a longer downloading time of the pdf format brochure, depending on the time when many people access the Internet.
- Transmission Electron Microscope (TEM)
- Scanning Electron Microscope (SEM)
- Ion Beam Application Equipment (FIB, CP)
- Instruments for Microarea and Surface Analysis (EPMA, Auger, XPS, ESCA)
- Nuclear Magnetic Resonance Spectrometer (NMR)
- Electron Spin Resonance Spectrometer (ESR)
- X-ray Fluorescence Spectrometer (XRF)
- Mass Spectrometer (MALDI-TOFMS, GC-MS, LC-MS)
- Semiconductor Equipment
- Additive Manufacturing Machine (AM)
- Industrial Equipment for thin-film formation and material processing
- Environmental countermeasure for analytical instruments
Product Guide
Transmission Electron Microscope (TEM)
-
CRYO ARM™ 300 II (JEM-3300) Field Emission Cryo-Electron Microscope
-
JEM-Z300FSC (CRYO ARM™ 300) Field Emission Cryo-Electron Microscope
-
JEM-Z200FSC (CRYO ARM™ 200) Field Emission Cryo-Electron Microscope
-
JEM-ARM300F2 GRAND ARM™ Atomic Resolution Electron Microscope
-
JEM-ARM300F GRAND ARM™ Atomic Resolution Electron Microscope
-
JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope
-
Monochromated JEM-ARM200F Atomic Resolution Analytical Electron Microscope
-
JEM-F200 Multi-purpose Electron Microscope
-
JEM-3200FS Field Emission Energy Filter Electron Microscope
-
JEM-2200FS Field Emission Electron Microscope
-
JEM-2100Plus Electron Microscope
-
JEM-1400Flash Electron Microscope
Options (TEM)
-
SightSKY Camera EM-04500SKY High-Sensitivity, Low-Noise Fiber-Coupling CMOS Camera
-
OBF System
-
JEM-1400/JEM-1400Plus Upgrading with Flash Camera
-
SAAF Octa Segmented Annular All Field Detector Octa
-
4DCanvas™ Pixelated STEM Detector
-
4DCanvas™ Application Data book
Integrated Dynamic Electron Solutions, Inc. / Products (TEM)
Scanning Electron Microscope (SEM)
FE-SEM
-
JSM-IT800 Schottky Field Emission Scanning Electron Microscope
-
JSM-IT800 Super Hybrid Lens (SHL) Schottky Field Emission Scanning Electron Microscope
-
JSM-IT800(i)/(is) Schottky Field Emission Scanning Electron Microscope
Options (FE-SEM)
Conventional SEM
-
JSM-IT510 InTouchScope™ Scanning Electron Microscope
-
JSM-IT700HR InTouchScope™ Scanning Electron Microscope
-
JSM-IT500HR InTouchScope™ Scanning Electron Microscope
-
JSM-IT200 InTouchScope™ Scanning Electron Microscope
-
JCM-7000 NeoScope™ Versatile Benchtop SEM
-
JCM-7000 NeoScope™ Versatile Benchtop SEM
Options (Conventional SEM)
Ion Beam Application Equipment (FIB, CP)
MultiBeam System (FIB)
Options (FIB)
Specimen Preparation Equipment (CP)
-
IB-10500HMS CROSS SECTION POLISHER™ High Throughput Milling System
-
IB-19520CCP CROSS SECTION POLISHER™
-
IB-19530CP CROSS SECTION POLISHER™
Options (CP)
Instruments for Microarea and Surface Analysis (EPMA, Auger, XPS, ESCA)* EPMA is an abbreviation of Electron Probe Microanalyzer.
Electron Probe Microanalyzer (EPMA)
-
JXA-iHP200F Schottky field emission Electron Probe Microanalyzer
JXA-iSP100 Tungsten/LaB6 Electron Probe Microanalyzer -
JXA-8530FPlus Field Emission Electron Probe Microanalyzer (FE-EPMA)
-
JXA-8230 Electron Probe Microanalyzer (EPMA)
Options (EPMA)
Auger Microprobe (Auger)
Options (Auger)
Photoelectron Spectrometer (ESCA)
Nuclear Magnetic Resonance Spectrometer(NMR)
Electron Spin Resonance Spectrometer (ESR)
X-ray Fluorescence Spectrometer (XRF)
Mass Spectrometer(MS)
GC-MS, Gas Analysis MS
-
JMS-Q1600GC UltraQuad™ SQ-Zeta Gas Chromatograph Quadrupole Mass Spectrometer
-
JMS-T2000GC AccuTOF™ GC-Alpha High Performance Gas Chromatograph - Time-of-Flight Mass Spectrometer
-
JMS-TQ4000GC GC Triple Quadrupole Mass Spectrometer
-
JMS-800D High-Resolution Mass Spectrometer
-
JMS-700 MStation Mass Spectrometer
Options (GC-MS, Gas Analysis MS)
-
msFineAnalysis series (GC-MS integrated qualitative analysis software)
-
JMS-T2000GC AccuTOF™ GC-Alpha Petroleum and Petrochemical Solutions
-
Comprehensive 2D GC coupled with JEOL GC-HRTOFMS : GCxGC Applications
LC-MS (DART™-MS), MALDI-TOFMS
-
JMS-T100LP AccuTOF™ LC-Express Atmospheric pressure ionization high-resolution time-of-flight mass spectrometer
-
JMS-S3000 SpiralTOF™-plus 2.0 Ultra-High Mass-Resolution MALDI-TOFMS System
Options (LC-MS (DART™-MS), MALDI-TOFMS)
Semiconductor Equipment
Additive Manufacturing Machine (AM)
Industrial Equipment for thin-film formation and material processing
Thin Film Formation Equipment (E-Beam and Plasma Sources, etc.)
-
JEBG BS-60/JST BS-ICE Series Electron Beam Sources and Power Supplies
-
BS-60610BDS Bombardment Deposition Source
-
BS-60250DEM Electron Beam Source
-
BS-800 Series/BS-920 Series Plasma-Assist Plasma Source/Power Supply
-
BS-40 Series Rotary Sensor
-
JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)
-
RF Induction Thermal Plasma System
-
TP-99140FDR Fine Powder Feeder
Material Processing Equipment (For Metal Melting and Nanopowder Synthesis, etc.)
-
RF Induction Thermal Plasma System
-
TP-400020NPS Thermal Plasma Nanopowder Synthesis System
-
TP-99140FDR Fine Powder Feeder
-
JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)
Environmental countermeasure for analytical instruments
To read a pdf format document, Adobe Reader (version 7.0 or higher recommended).