Catalogue Download

Product Guide

• 
  Product Guide

Transmission Electron Microscope (TEM)

• 
  JEM-Z300FSC (CRYO ARM™ 300) Field Emission Cryo-Electron Microscope
• 
  JEM-Z200FSC (CRYO ARM™ 200) Field Emission Cryo-Electron Microscope
• 
  JEM-ARM300F2 GRAND ARM™ Atomic Resolution Electron Microscope
• 
  JEM-ARM300F GRAND ARM™ Atomic Resolution Electron Microscope
• 
  JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope
• 
  Monochromated JEM-ARM200F Atomic Resolution Analytical Electron Microscope
• 
  JEM-F200 Multi-purpose Electron Microscope
• 
  JEM-3200FS Field Emission Energy Filter Electron Microscope
• 
  JEM-2200FS Field Emission Electron Microscope
• 
  JEM-2100Plus Electron Microscope
• 
  JEM-1400Flash Electron Microscope

Options (TEM)

• 
  JEM-1400/JEM-1400Plus Upgrading with Flash Camera
• 
  SAAF Octa Segmented Annular All Field Detector Octa
• 
  4DCanvas™ Pixelated STEM Detector
• 
  JEM-2100 Time-resolved TEM (Ultrafast TEM / Dynamic TEM)

Scanning Electron Microscope (SEM)

FE-SEM

• 
  JSM-IT800 Schottky Field Emission Scanning Electron Microscope
• 
  JSM-IT800 Super Hybrid Lens (SHL) Schottky Field Emission Scanning Electron Microscope
• 
  JSM-7900F Schottky Field Emission Scanning Electron Microscope
• 
  JSM-7610FPlus Schottky Field Emission Scanning Electron Microscope
• 
  JSM-7610FPlus GENTLEBEAM(TM) Super High Resolution (GBSH)
• 
  JSM-7200F Schottky Field Emission Scanning Electron Microscope
• 
  JSM-F100 Schottky Field Emission Scanning Electron Microscope

Options (FE-SEM)

• 
  SS-94000SXES/SS-94040SXSER Super Spectrometer

Conventional SEM

• 
  JSM-IT700HR InTouchScope™ Scanning Electron Microscope
• 
  JSM-IT500HR InTouchScope™ Scanning Electron Microscope
• 
  JSM-IT500 InTouchScope™ Scanning Electron Microscope
• 
  JSM-IT200 InTouchScope™ Scanning Electron Microscope
• 
  JCM-7000 NeoScope™ Versatile Benchtop SEM
• 
  JCM-7000 NeoScope™ Versatile Benchtop SEM

Ion Beam Application Equipment (FIB、IS、CP)

MultiBeam System (FIB)

• 
  JIB-4700F Multi Beam System
• 
  JIB-4000PLUS Focused Ion Beam Milling & Imaging System

Options (FIB)

• 
  IB-07080ATLPS, IB-77080ATLPS Automatic TEM Specimen Preparation System STEMPLING

Specimen Preparation Equipment (IS)

• 
  EM-09100IS Ion Slicer™
• 
  IB-09060CIS Cryo Ion Slicer™

Specimen Preparation Equipment (CP)

• 
  IB-19520CCP CROSS SECTION POLISHER™
• 
  IB-19530CP CROSS SECTION POLISHER™

Options (CP)

• 
  CROSS SECTION POLISHER™ Precise Positioning Microscope
• 
  CROSS SECTION POLISHER™ Precise Positioning Microscope TYPE2

Instruments for Microarea and Surface Analysis (EPMA、Auger、XPS、ESCA)* EPMA is an abbreviation of Electron Probe Microanalyzer.

Electron Probe Microanalyzer (EPMA)

• 
  JXA-iHP200F Schottky field emission Electron Probe Microanalyzer
  JXA-iSP100 Tungsten/LaB₆ Electron Probe Microanalyzer
• 
  JXA-8530FPlus Field Emission Electron Probe Microanalyzer (FE-EPMA)
• 
  JXA-8230 Electron Probe Microanalyzer (EPMA)

Options (EPMA)

• 
  SS-94000SXES/SS-94040SXSER Super Spectrometer

Auger Microprobe (Auger)

• 
  JAMP-9510F Field Emission Auger Microprobe

Photoelectron Spectrometer (ESCA)

• 
  JPS-9030 Photoelectron Spectrometer (XPS)

Nuclear Magnetic Resonance Spectrometer(NMR)

• 
  JNM-ECZR series FT NMR
• 
  JNM-ECZS series FT NMR

Electron Spin Resonance Spectrometer (ESR)

• 
  JES-X3 Series ESR

X-ray Fluorescence Spectrometer (XRF)

• 
  JSX-1000S X-ray fluorescence spectrometer (XRF)

Mass Spectrometer(MS)

GC-MS、Gas Analysis MS

• 
  JMS-T200GC AccuTOF™ GCx-plus High Performance Gas Chromatograph – Time-of-Flight Mass Spectrometer
• 
  JMS-TQ4000GC GC Triple Quadrupole Mass Spectrometer
• 
  JMS-Q1500GC Master-Quad GC/MS
• 
  JMS-MT3010HRGA INFITOF Multi-Turn Time-of-Flight Mass Spectrometer
• 
  JMS-800D High-Resolution Mass Spectrometer
• 
  JMS-700 MStation Mass Spectrometer

Options (GC-MS、Gas Analysis MS)

• 
  JMS-T200GC AccuTOF™ GCx-plus Petroleum and Petrochemical Solutions
• 
  msFineAnalysis Auto analysis software

LC-MS(DART-MS)、MALDI-TOFMS

• 
  MS-T100LP AccuTOF™ LC-plus 4G Atmospheric Pressure Ionization High Resolution Time-of-Flight Mass Spectrometer
• 
  JMS-S3000 SpiralTOF™-plus Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometer

Options (LC-MS(DART-MS)、MALDI-TOFMS)

• 
  msRepeatFinder Polymer Analysis Software

Semiconductor Equipment

• 
  JBX-8100FS Series Electron Beam Lithography System
• 
  JBX-9500FS Electron Beam Lithography System
• 
  JBX Series Electron Beam Lithography System

Industrial Equipment for thin-film formation and material processing

• 
  Industrial Equipment General Catalog

Thin Film Formation Equipment (E-Beam and Plasma Sources, etc.)

• 
  JEBG BS-60/JST BS-ICE Series Electron Beam Sources and Power Supplies
• 
  BS-800 Series/BS-920 Series Plasma-Assist Plasma Source/Power Supply
• 
  BS-40 Series Rotary Sensor
• 
  RF Induction Thermal Plasma System
• 
  TP-99140FDR Fine Powder Feeder
• 
  BS-60250DEM Electron Beam Source
• 
  BS-60610BDS Bombardment Deposition Source

Material Processing Equipment (For Metal Melting and Nanopowder Synthesis, etc.)

• 
  TP-400020NPS Thermal Plasma Nanopowder Synthesis System
• 
  TP-99140FDR Fine Powder Feeder
• 
  RF Induction Thermal Plasma System