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  • Catalogue Download

Catalogue Download

You can download each catalogue of JEOL products, in the pdf format.
When you click the front cover of the brochure you want to download, the relevant pdf document appears.
Please note that there may exist a longer downloading time of the pdf format brochure, depending on the time when many people access the Internet.

  • Transmission Electron Microscope (TEM)
  • Scanning Electron Microscope (SEM)
  • Ion Beam Application Equipment (FIB, CP)
  • Instruments for Microarea and Surface Analysis (EPMA, Auger, XPS, ESCA)
  • Nuclear Magnetic Resonance Spectrometer (NMR)
  • Electron Spin Resonance Spectrometer (ESR)
  • X-ray Fluorescence Spectrometer (XRF)
  • Mass Spectrometer (MALDI-TOFMS, GC-MS, LC-MS)
  • Semiconductor Equipment
  • Additive Manufacturing Machine (AM)
  • Industrial Equipment for thin-film formation and material processing
  • Environmental countermeasure for analytical instruments

Product Guide

  • Product Guide
    Product Guide

Transmission Electron Microscope (TEM)

  • CRYO ARM™ 300 II (JEM-3300) Field Emission Cryo-Electron Microscope
    CRYO ARM™ 300 II (JEM-3300) Field Emission Cryo-Electron Microscope
  • JEM-Z300FSC (CRYO ARM™ 300) Field Emission Cryo-Electron Microscope
    JEM-Z300FSC (CRYO ARM™ 300) Field Emission Cryo-Electron Microscope
  • JEM-Z200FSC (CRYO ARM™ 200) Field Emission Cryo-Electron Microscope
    JEM-Z200FSC (CRYO ARM™ 200) Field Emission Cryo-Electron Microscope
  • JEM-ARM300F2 GRAND ARM™ Atomic Resolution Electron Microscope
    JEM-ARM300F2 GRAND ARM™ Atomic Resolution Electron Microscope
  • JEM-ARM300F GRAND ARM™ Atomic Resolution Electron Microscope
    JEM-ARM300F GRAND ARM™ Atomic Resolution Electron Microscope
  • JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope
    JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope
  • Monochromated JEM-ARM200F Atomic Resolution Analytical Electron Microscope
    Monochromated JEM-ARM200F Atomic Resolution Analytical Electron Microscope
  • JEM-F200 Multi-purpose Electron Microscope
    JEM-F200 Multi-purpose Electron Microscope
  • JEM-3200FS Field Emission Energy Filter Electron Microscope
    JEM-3200FS Field Emission Energy Filter Electron Microscope
  • JEM-2200FS Field Emission Electron Microscope
    JEM-2200FS Field Emission Electron Microscope
  • JEM-2100Plus Electron Microscope
    JEM-2100Plus Electron Microscope
  • JEM-1400Flash Electron Microscope
    JEM-1400Flash Electron Microscope

Options (TEM)

  • SightSKY Camera EM-04500SKY High-Sensitivity, Low-Noise Fiber-Coupling CMOS Camera
    SightSKY Camera EM-04500SKY High-Sensitivity, Low-Noise Fiber-Coupling CMOS Camera
  • OBF System
    OBF System
  • JEM-1400/JEM-1400Plus Upgrading with Flash Camera
    JEM-1400/JEM-1400Plus Upgrading with Flash Camera
  • SAAF Octa Segmented Annular All Field Detector Octa
    SAAF Octa Segmented Annular All Field Detector Octa
  • 4DCanvas(TM) Pixelated STEM Detector
    4DCanvas™ Pixelated STEM Detector
  • 4DCanvas™ Application Data book
    4DCanvas™ Application Data book

Integrated Dynamic Electron Solutions, Inc. / Products (TEM)

  • RELATIVITY Electrostatic Subframing System
    RELATIVITY Electrostatic Subframing System
  • EDM Basic (Electrostatic Dose Modulator)
    EDM Basic (Electrostatic Dose Modulator)
  • Luminary Micro Compact Specimen Photoexcitation System
    Luminary Micro Compact Specimen Photoexcitation System
  • EDS True Area Scan (optional feature of EDM)
    EDS True Area Scan (optional feature of EDM)
  • Programmable STEM with EDM Synchrony
    Programmable STEM with EDM Synchrony
  • JEM-2100 Time-resolved TEM (Ultrafast TEM / Dynamic TEM)
    JEM-2100 Time-resolved TEM (Ultrafast TEM / Dynamic TEM)

Scanning Electron Microscope (SEM)

FE-SEM

  • JSM-IT800 Schottky Field Emission Scanning Electron Microscope
    JSM-IT800 Schottky Field Emission Scanning Electron Microscope
  • JSM-IT800 Super Hybrid Lens 〈SHL〉 Schottky Field Emission Scanning Electron Microscope
    JSM-IT800 Super Hybrid Lens (SHL) Schottky Field Emission Scanning Electron Microscope
  • JSM-IT800(i)/(is) Schottky Field Emission Scanning Electron Microscope
    JSM-IT800(i)/(is) Schottky Field Emission Scanning Electron Microscope

Options (FE-SEM)

  • SS-94000SXES/SS-94040SXSER Super Spectrometer
    SS-94000SXES/SS-94040SXSER Super Spectrometer

Conventional SEM

  • JSM-IT510 InTouchScope(TM) Scanning Electron Microscope
    JSM-IT510 InTouchScope™ Scanning Electron Microscope
  • JSM-IT700HR InTouchScope(TM) Scanning Electron Microscope
    JSM-IT700HR InTouchScope™ Scanning Electron Microscope
  • JSM-IT500HR InTouchScope(TM) Scanning Electron Microscope
    JSM-IT500HR InTouchScope™ Scanning Electron Microscope
  • JSM-IT200 InTouchScope(TM) Scanning Electron Microscope
    JSM-IT200 InTouchScope™ Scanning Electron Microscope
  • JCM-7000 NeoScope(TM) Versatile Benchtop SEM
    JCM-7000 NeoScope™ Versatile Benchtop SEM
  • JCM-7000 NeoScope(TM) Versatile Benchtop SEM
    JCM-7000 NeoScope™ Versatile Benchtop SEM

Options (Conventional SEM)

  • EDS for JSM-IT200 / DrySD(TM)60
    EDS for JSM-IT200 / DrySD™60
  • JCM-7000 NeoScope™ Benchtop Tools for Foreign Material Analysis and Material Determination
    JCM-7000 NeoScope™ Benchtop Tools for Foreign Material Analysis and Material Determination
  • JCM-7000 NeoScope™ Benchtop Tools for Quality Assurance
    JCM-7000 NeoScope™ Benchtop Tools for Quality Assurance

Ion Beam Application Equipment (FIB, CP)

MultiBeam System (FIB)

  • JIB-4700F Multi Beam System
    JIB-4700F Multi Beam System
  • JIB-4000PLUS
    JIB-4000PLUS Focused Ion Beam Milling & Imaging System

Options (FIB)

  • IB-07080ATLPS, IB-77080ATLPS Automatic TEM Specimen Preparation System STEMPLING
    IB-07080ATLPS, IB-77080ATLPS Automatic TEM Specimen Preparation System STEMPLING

Specimen Preparation Equipment (CP)

  • IB-10500HMS CROSS SECTION POLISHER(TM) High Throughput Milling System
    IB-10500HMS CROSS SECTION POLISHER™ High Throughput Milling System
  • IB-19520CCP CROSS SECTION POLISHER(TM)
    IB-19520CCP CROSS SECTION POLISHER™
  • IB-19530CP CROSS SECTION POLISHER(TM)
    IB-19530CP CROSS SECTION POLISHER™

Options (CP)

  • CROSS SECTION POLISHER(TM) Precise Positioning Microscope
    CROSS SECTION POLISHER™ Precise Positioning Microscope
  • CROSS SECTION POLISHER(TM) Precise Positioning Microscope TYPE2
    CROSS SECTION POLISHER™ Precise Positioning Microscope TYPE2

Instruments for Microarea and Surface Analysis (EPMA, Auger, XPS, ESCA)* EPMA is an abbreviation of Electron Probe Microanalyzer.

Electron Probe Microanalyzer (EPMA)

  • JXA-iHP200F Schottky field emission Electron Probe Microanalyzer  and JXA-iSP100 Tungsten/LaB6 Electron Probe Microanalyzer
    JXA-iHP200F Schottky field emission Electron Probe Microanalyzer
    JXA-iSP100 Tungsten/LaB6 Electron Probe Microanalyzer
  • JXA-8530FPlus Field Emission Electron Probe Microanalyzer(FE-EPMA)
    JXA-8530FPlus Field Emission Electron Probe Microanalyzer (FE-EPMA)
  • JXA-8230 Electron Probe Microanalyzer (EPMA)
    JXA-8230 Electron Probe Microanalyzer (EPMA)

Options (EPMA)

  • SS-94000SXES/SS-94040SXSER Super Spectrometer
    SS-94000SXES/SS-94040SXSER Super Spectrometer

Auger Microprobe (Auger)

  • JAMP-9510F Field Emission Auger Microprobe
    JAMP-9510F Field Emission Auger Microprobe

Options (Auger)

  • Spectrum Image
    Spectrum Image

Photoelectron Spectrometer (ESCA)

  • JPS-9030 Photoelectron Spectrometer (XPS)
    JPS-9030 Photoelectron Spectrometer (XPS)

Nuclear Magnetic Resonance Spectrometer(NMR)

  • JNM-ECZL series FT NMR
    JNM-ECZL series FT NMR
  • JNM-ECZR series FT NMR
    JNM-ECZR series FT NMR
  • JNM-ECZS series FT NMR
    JNM-ECZS series FT NMR
  • Solid State NMR
    Solid State NMR
  • ROYALPROBE(TM) HFX
    ROYALPROBE™ HFX
  • Data Integrity Compliance of  JEOL NMR
    Data Integrity Compliance of JEOL NMR

Electron Spin Resonance Spectrometer (ESR)

  • JES-X3 Series ESR
    JES-X3 Series ESR

X-ray Fluorescence Spectrometer (XRF)

  • JSX-1000S X-ray fluorescence spectrometer (XRF)
    JSX-1000S X-ray fluorescence spectrometer (XRF)

Mass Spectrometer(MS)

GC-MS, Gas Analysis MS

  • JMS-Q1600GC UltraQuad™ SQ-Zeta Gas Chromatograph Quadrupole Mass Spectrometer
    JMS-Q1600GC UltraQuad™ SQ-Zeta Gas Chromatograph Quadrupole Mass Spectrometer
  • JMS-T2000GC AccuTOF(TM) GC-Alpha High Performance Gas Chromatograph - Time-of-Flight Mass Spectrometer
    JMS-T2000GC AccuTOF™ GC-Alpha High Performance Gas Chromatograph - Time-of-Flight Mass Spectrometer
  • JMS-TQ4000GC GC Triple Quadrupole Mass Spectrometer
    JMS-TQ4000GC GC Triple Quadrupole Mass Spectrometer
  • JMS-800D High-Resolution Mass Spectrometer
    JMS-800D High-Resolution Mass Spectrometer
  • JMS-700 MStation Mass Spectrometer
    JMS-700 MStation Mass Spectrometer

Options (GC-MS, Gas Analysis MS)

  • msFineAnalysis
    msFineAnalysis series (GC-MS integrated qualitative analysis software)
  • Petroleum and Petrochemical Solutions
    JMS-T2000GC AccuTOF™ GC-Alpha Petroleum and Petrochemical Solutions
  • Petroleum and Petrochemical Solutions
    Comprehensive 2D GC coupled with JEOL GC-HRTOFMS : GCxGC Applications

LC-MS (DART™-MS), MALDI-TOFMS

  • JMS-T100LP AccuTOF(TM) LC-Express Atmospheric pressure ionization high-resolution time-of-flight mass spectrometer
    JMS-T100LP AccuTOF™ LC-Express Atmospheric pressure ionization high-resolution time-of-flight mass spectrometer
  • JMS-S3000 SpiralTOF™-plus 2.0 Ultra-High Mass-Resolution MALDI-TOFMS System
    JMS-S3000 SpiralTOF™-plus 2.0 Ultra-High Mass-Resolution MALDI-TOFMS System

Options (LC-MS (DART™-MS), MALDI-TOFMS)

  • msRepeatFinder Polymer Analysis Software
    msRepeatFinder Polymer Analysis Software
  • MALDI-TOFMS imaging system JEOL×SCiLS
    MALDI-TOFMS imaging system JEOL×SCiLS

Semiconductor Equipment

  • JBX-8100FS Series Electron Beam Lithography System
    JBX-8100FS Series Electron Beam Lithography System
  • JBX-9500FS Electron Beam Lithography System
    JBX-9500FS Electron Beam Lithography System
  • JBX Series Electron Beam Lithography System
    JBX Series Electron Beam Lithography System

Additive Manufacturing Machine (AM)

  • JAM-5200EBM Electron Beam Metal AM Machine
    JAM-5200EBM Electron Beam Metal AM Machine

Industrial Equipment for thin-film formation and material processing

  • Industrial Equipment General Catalog
    Industrial Equipment General Catalog

Thin Film Formation Equipment (E-Beam and Plasma Sources, etc.)

  • JEBG BS-60/JST BS-ICE Series Electron Beam Sources and Power Supplies
    JEBG BS-60/JST BS-ICE Series Electron Beam Sources and Power Supplies
  • BS-60610BDS Bombardment Deposition Source
    BS-60610BDS Bombardment Deposition Source
  • BS-60250DEM Electron Beam Source
    BS-60250DEM Electron Beam Source
  • BS-800 Series/BS-920 Series Plasma-Assist Plasma Source/Power Supply
    BS-800 Series/BS-920 Series Plasma-Assist Plasma Source/Power Supply
  • BS-40 Series Rotary Sensor
    BS-40 Series Rotary Sensor
  • JEBG series High-power electron beam sources
    JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)
  • RF Induction Thermal Plasma System
    RF Induction Thermal Plasma System
  • TP-99140FDR Fine Powder Feeder
    TP-99140FDR Fine Powder Feeder

Material Processing Equipment (For Metal Melting and Nanopowder Synthesis, etc.)

  • RF Induction Thermal Plasma System
    RF Induction Thermal Plasma System
  • TP-400020NPS Thermal Plasma Nanopowder Synthesis System
    TP-400020NPS Thermal Plasma Nanopowder Synthesis System
  • TP-99140FDR Fine Powder Feeder
    TP-99140FDR Fine Powder Feeder
  • JEBG series High-power electron beam sources
    JEBG・BS / JST・ST series (JEBG series High-power electron beam sources)

Environmental countermeasure for analytical instruments

  • Environmental Engineering Technology for Advanced Analytical Instruments
    Environmental Engineering Technology for Advanced Analytical Instruments
  • Room temperature control ・Airflow countermeasure
    Room temperature control ・Airflow countermeasure
  • Magnetic field countermeasure
    Magnetic field countermeasure
  • Vibration countermeasure
    Vibration countermeasure

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