Catalogue Download
You can download each catalogue of JEOL products, in the pdf format.
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- Transmission Electron Microscope (TEM)
- Scanning Electron Microscope (SEM)
- Ion Beam Application Equipment (FIB、IS、CP)
- Instruments for Microarea and Surface Analysis (EPMA、Auger、XPS、ESCA)
- Nuclear Magnetic Resonance Spectrometer (NMR)
- Electron Spin Resonance Spectrometer (ESR)
- X-ray Fluorescence Spectrometer (XRF)
- Mass Spectrometer (MALDI-TOFMS、GC-MS、LC-MS)
- Semiconductor Equipment
- Industrial Equipment for thin-film formation and material processing
Product Guide
Transmission Electron Microscope (TEM)
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JEM-Z300FSC (CRYO ARM™ 300) Field Emission Cryo-Electron Microscope
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JEM-Z200FSC (CRYO ARM™ 200) Field Emission Cryo-Electron Microscope
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JEM-ARM300F2 GRAND ARM™ Atomic Resolution Electron Microscope
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JEM-ARM300F GRAND ARM™ Atomic Resolution Electron Microscope
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JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope
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Monochromated JEM-ARM200F Atomic Resolution Analytical Electron Microscope
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JEM-F200 Multi-purpose Electron Microscope
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JEM-3200FS Field Emission Energy Filter Electron Microscope
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JEM-2200FS Field Emission Electron Microscope
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JEM-2100Plus Electron Microscope
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JEM-1400Flash Electron Microscope
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JEM-1400/JEM-1400Plus Upgrading with Flash Camera
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SAAF Octa Segmented Annular All Field Detector Octa
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4DCanvas™ Pixelated STEM Detector
Scanning Electron Microscope (SEM)
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JSM-7900F Schottky Field Emission Scanning Electron Microscope
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JSM-7610FPlus Schottky Field Emission Scanning Electron Microscope
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JSM-7610FPlus GENTLEBEAM(TM) Super High Resolution (GBSH)
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JSM-7200F Schottky Field Emission Scanning Electron Microscope
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JSM-F100 Schottky Field Emission Scanning Electron Microscope
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JSM-IT500HR InTouchScope™ Scanning Electron Microscope
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JSM-IT500 InTouchScope™ Scanning Electron Microscope
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JSM-IT200 InTouchScope™ Scanning Electron Microscope
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JCM-6000Plus NeoScope™ Versatile Benchtop SEM
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JCM-7000 NeoScope™ Versatile Benchtop SEM
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JCM-7000 NeoScope™ Versatile Benchtop SEM
Ion Beam Application Equipment (FIB、IS、CP)
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JIB-4700F Multi Beam System
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JIB-4000PLUS Focused Ion Beam Milling & Imaging System
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IB-19520CCP CROSS SECTION POLISHER
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IB-19530CP CROSS SECTION POLISHER™
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CROSS SECTION POLISHER™ Precise Positioning Microscope
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CROSS SECTION POLISHER™ Precise Positioning Microscope TYPE2
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EM-09100IS Ion Slicer™
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IB-09060CIS Cryo Ion Slicer™
Instruments for Microarea and Surface Analysis (EPMA、Auger、XPS、ESCA)
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JXA-iHP200F Schottky field emission Electron Probe Microanalyzer
JXA-iSP100 Tungsten/LaB6 Electron Probe Microanalyzer -
JXA-8530FPlus Field Emission Electron Probe Microanalyzer (FE-EPMA)
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JXA-8230 Electron Probe Microanalyzer (EPMA)
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SS-94000SXES/SS-94040SXSER Super Spectrometer
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JAMP-9510F Field Emission Auger Microprobe
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JPS-9030 Photoelectron Spectrometer (XPS)
Nuclear Magnetic Resonance Spectrometer(NMR)
Electron Spin Resonance Spectrometer (ESR)
X-ray Fluorescence Spectrometer (XRF)
Mass Spectrometer(MS)
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JMS-MT3010HRGA INFITOF Multi-Turn Time-of-Flight Mass Spectrometer
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JMS-S3000 SpiralTOF™-plus Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometer
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msRepeatFinder Polymer Analysis Software
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JMS-T200GC AccuTOF™ GCx-plus High Performance Gas Chromatograph – Time-of-Flight Mass Spectrometer
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msFineAnalysis Auto analysis software
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JMS-T200GC AccuTOF™ GCx-plus Petroleum and Petrochemical Solutions
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JMS-TQ4000GC GC Triple Quadrupole Mass Spectrometer
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JMS-Q1500GC Master-Quad GC/MS
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MS-T100LP AccuTOF™ LC-plus 4G Atmospheric Pressure Ionization High Resolution Time-of-Flight Mass Spectrometer
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JMS-700 MStation Mass Spectrometer
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JMS-800D High-Resolution Mass Spectrometer
Semiconductor Equipment
Industrial Equipment for thin-film formation and material processing
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Industrial Equipment General Catalog
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JEBG BS-60/JST BS-ICE Series Electron Beam Sources and Power Supplies
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BS/EBG/JEBG/JST series Electron Beam Sources and Power Supplies for vacuum deposition
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RF Induction Thermal Plasma System
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TP-400020NPS Thermal Plasma Nanopowder Synthesis System
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TP-99140FDR Fine Powder Feeder
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