Release of the New Electron Microscope JEM-1400Flash -With a New Montage System to Capture Ultra-Wide Area Images-

2017/05/30

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new electron microscope, JEM-1400Flash, to be released in May 2017.

Product development background

The transmission electron microscope (TEM) is used in a wide range of fields, such as biology, nanotechnology, polymer, and advanced materials. In the observation of biological specimens or macro-molecular materials, usually the entire structures of cellular tissues or materials are first confirmed at low magnification, and then fine structures of interest are carefully studied at high magnification. To smoothly observe biological specimens, recent demands for easier observation steps to acquire higher-throughput image data are increasing. To meet those needs, JEOL has developed a new electron microscope "JEM-1400Flash", which is equipped with a high-sensitivity sCMOS camera, an ultra-wide area montage system, and an OM (optical microscope) image linkage function.

Main Features

  • New function: Ultra-wide area montage system, Limitless Panorama (LLP)
    In addition to the conventional electromagnetic image shift, the JEM-1400Flash comes with a montage system capable of utilizing stage drive for the field shift. This new system allows for simple capture of a montage panorama image over a limitless wide area. Thus, an ultra-wide area, high pixel-resolution image is obtainable, which is comparable to the image taken by conventional photo film.
  • New function: OM image linkage function, Picture Overlay
    A digital image acquired with an OM can be overlaid on a TEM image. Since an observation area can be searched on the overlaid image, high resolution observation of a fluorescence site is easily made on the TEM image.
  • High-sensitivity sCMOS camera, "Matataki Flash" camera
    "Matataki Flash", JEOL’s innovative high-sensitivity sCMOS camera, dramatically reduces the readout noise while possessing high frame rate. This powerful feature enables high-throughput acquisition of sharp TEM images with extremely low-noise.

Main Specifications

Resolution 0.2 nm (HC: high contrast polepiece), 0.14 nm (HR: high resolution polepiece)
Accelerating voltage 10 kV to 120 kV
Magnification ×10 to ×1,200,000 (HC), ×10 to ×1,500,000 (HR)
Maximum tilt angle ± 70°
Vacuum system TMP (turbo molecular pump)
JEOL_JEM-1400Flash

Annual unit sales target

90 units/year