Release of the New Field Emission Cryo-Electron Microscope JEM-Z300FSC

2017/06/26

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new field-emission cryo-electron microscope, the JEM-Z300FSC (CRYO ARM™ 300), to be released in June 2017.

Product development background

The cryo-electron microscope (cryo-EM) now enables "near atomic scale" structural analysis of viruses and proteins. Under this circumstance, much higher stability is required for hardware and software of the cryo-EM. To meet the needs of cryo-EM users, JEOL has developed a 300 kV cryo-EM "CRYO ARM™ 300", which follows a recently-developed 200 kV cryo-EM, "CRYO ARM™ 200". This new cryo-EM "CRYO ARM™ 300" achieves unprecedented resolution and stability.

Main Features

  • Automated specimen exchange system
    The system is composed of a specimen stage to cool samples to liquid nitrogen temperature and a cryo-transfer system to automatically transfer the cooled samples to the cryo-stage. Liquid nitrogen is automatically supplied to the liquid nitrogen tank as required. This automated system features the storing of up to 12 samples and the exchange of an arbitrary one or more samples while the rest of the samples are kept cooled between the specimen stage and specimen exchange system. These unique capabilities enable flexible scheduling.
  • Cold field emission gun (Cold FEG)
    A Cold FEG produces a high-brightness electron beam with very small energy spread, offering high coherency. Thus, the CRYO ARM™ 300 achieves high resolution, high contrast imaging.
  • In-column Omega energy filter
    Equipped with an in-column Omega energy filter, the CRYO ARM™ 300 acquires energy filtered images and energy loss spectra. Zero-loss images acquired with the microscope provide high contrast with reduced chromatic aberration.
  • Automated image acquisition software for Single Particle Analysis
    The CRYO ARM™ 300 incorporates automated software. The software allows for automated detection of holes on the specimen grid for efficient acquisition of Single Particle Analysis images.
  • Hole-free phase plate *1
    This unique phase plate is suitable for higher contrast in biological specimens that originally provide only low contrast.
  • Auto adjustment functions *2
    Auto focus, auto coma-free alignment, auto parallel-beam illumination and other automated adjustments are available, enabling image acquisition under optimum conditions.

*1: Optional unit. *2: Images acquired with the bottom mount camera are used.

Main Specifications

Main instrument

Electron gun Cold field emission gun (Cold FEG)
Accelerating voltage 300kV
Energy filter In-column Omega energy filter
Maximum specimen tilt angle ± 70°

Specimen Stage / Automated specimen exchange system

Specimen stage
Coolant Liquid nitrogen
Automated liquid-nitrogen filling system built-in
Specimen cooling temperature 100K or less
Temperature measurement position Specimen, Cryo-shield, LN2 tank
Specimen movements
X、Y Motor drive (movements: ±1 mm)
Piezoelectric elements (movements: ±0.5 μm)
Z Motor drive (movements: ±0.2 mm)
Tilt-X Motor drive (tilts: ±70°)
Rotation within the specimen plane 0° or  90°
Specimen exchange system Air-lock
Automated cryo-transfer system built-in
Cooling temperature
(specimen exchange chamber)
105K or less
Specimen exchange cartridge Up to 4 specimens can be changed at one time.
Specimen parking stage Up to 12 specimens can be held.
JEOL_JEM-Z300FSC

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