JCM-7000 NeoScope™ Benchtop SEM

Features
Application
Related Products
Information

Features

Benchtop scanning electron microscopes are used in a wide range of fields, such as electrical, electronics, automobiles, machinery, chemical, and pharmaceutical industries. In addition, SEM applications are expanding to not only cover research and development, but also address quality control and product inspection at manufacturing sites. With this, demands for further improved work efficiency, much faster and easier operation, and a higher degree of analytical and measurement capabilities, are increasing.

The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". The JCM-7000 incorporates three innovative functions; "Zeromag" for smooth transition from optical to SEM imaging, "Live Analysis" for finding constituent elements for an image observation area, and "Live 3D" for displaying a reconstructed live 3D image during SEM observation.

When you place the JCM-7000 next to an optical microscope, further-faster and more-detailed foreign material analysis and quality control can be made.

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Speedy observation and analysis with no specimen treatment using the benchtop SEM JCM-7000!
-Introduction to the effective use of Low-Vacuum(LV) mode-

Why don't you try an SEM observation of insulating specimens that do not conduct electricity as they are, without any pre-treatment?
We will introduce examples of effective use of the JCM-7000 in a low vacuum (LV) mode for polymeric materials, industrial materials, minerals, foods, and living organisms/plants.

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JCM-7000 NeoScope™
JCM-7000 NeoScope™ flyer
JCM-7000 NeoScope™ Benchtop Tools for Foreign Material Analysis and Material Determination
JCM-7000 NeoScope™ Benchtop Tools for Quality Assurance

Comparison with OM

Features and Applications

Function explanation
by movies

Conventional SEM

In conventional SEM operation, SEM imaging and elemental analysis were separated (not seamless).

JCM-7000

With "Zeromag", the JCM-7000 enables seamless operation from optical to SEM imaging. Also with "Live Analysis", elemental analysis by EDS can be made during SEM image observation.

Comparison with OM

Accelerate your insight beyond an Optical Microscope

Contaminant analysis

Easy to detect foreign material
Easy to identify elemental composition
【Example】 Analysis of black foreign material adhered to surface of food product

OM image

In OM image, it is difficult to see the distribution of the whilte lubricant on the white granule(drug) surface and quality of its adhesion.

SEM Image (Backscattered electron compositional image)

SEM image from the same field of view (FOV) shows particles with different contrast indicating different compositions.

SEM Image (Backscattered electron compositional image) and elemental analysis result

SEM Image(Backscattered electron compositional image) and conmpsitional elemental analysis

Enlarging the area of interest accesses instant live EDS analysis with main elements identified.

Quality control

Observe detailed surface structures with high resolution and large depth of field not possible with OM imaging.
【Example】 Distribution observation of lubricant on the surface of granule(drug)

OM image

In OM image, it is difficult to see the distribution of the lubricant on the granule surface and quality of its adhesion.

SEM Image(Backscattered electron compositional image)

The superior depth of focus provided with SEM imaging over OM imaging along with the compositional contrast provided with the backscattered electron detector clearly shows the distribution of the lubricant on the surface of the granule.

SEM Image (Backscattered electron compositional image) and elemental analysis

Condition of the lubricant's adhesion can be observed with higher magnification.

Features and Applications

Functions that enable anyone to perform SEM/EDS operations

Zeromag & Low-Vacuum mode

Zeromag
Zoom the optical image to automatically switch to a SEM image!
Low-Vacuum mode
Viewing is simple with no pre-treatment needed for easily-charged samples.

Specimen: Salt

◆Click the "replay" button in the box above, and the movie will start (for 60 seconds)◆

Live! Live! Live!

Live Analysis
eliminates the need to consider SEM observation and EDS analysis as separate operations. When Live Map is selected, you can confirm the distribution of elements in the observed area in real-time.

Screening while performing observation with Live Analysis

Quickly check the element distribution with Live Map

Live 3D
The new high-sensitivity 4-segmented backscattered electron detector enables 2-pane viewing of a SEM image and a 3D image using Live 3D function. In addition to instantaneous shape determination for samples with complex topographies, depth information can also be acquired.

◆Click the "replay" button in the box above, and the movie will start (for 50 seconds)◆

SMILE VIEW™ Lab

All data can be managed from SMILE VIEW™ Lab Data management screen.
Review and re-analysis of previously-acquired data, and creation of reports can be performed easily.

◆Click the "replay" button in the box above, and the movie will start （2.5 min.）◆
This movie introduces you to the features and functions of Benchtop SEM JCM-7000　NeoScope™.

Function explanation by movies

The following movie introduces you to the functions of the Benchtop SEM JCM-7000 NeoScope™

Three features for easy operation

The JCM-7000 is characterized by its ease of use. Here are three features that even beginners will love.

Guided Workflow for easy data acquisition
Color image simplifies navigation
Advanced Auto Functions

Suitable for observation and analysis of a variety of specimens
– High vacuum mode provides higher quality measurements! –

The JCM-7000 is equipped with a high vacuum mode for observation and analysis of conductive specimens and low vacuum mode for observation and analysis of conductive specimens with no specimen treatment.
Therefore, the JCM-7000 can be used for SEM observation and EDS analysis of a diverse range of specimens.

Leave both observation and analysis to us

JEOL develops and manufactures both SEM and EDS in-house.
Both SEM observation and EDS analysis can be operated at an optimal position and within the same user interface.
The movie introduces you to the three EDS screening functions during image observation.