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JEM-F200 in motion (Youtube)
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The JEM-F200 has a new, and fine appearance.
It incorporates a new, intuitive user interface specifically designed for analytical electron microscopy.
It also features outstanding mechanical and electrical stability, which reflects JEOL's engineering expertise accumulated over the years.
Quad-Lens condenser system
Today's electron microscopy requires to support a wide range of imaging techniques from bright field/dark field TEM to STEM that uses a variety of detectors.
The JEM-F200, with its new 4-stage probe-forming optical system, that is, Quad-Lens Condenser System, controls intensity and the convergence angle of electron beam independently, to respond to the different research requirements.
Advanced Scan system
The JEM-F200 incorporates a new scanning system, Advanced Scan System, which is capable of scanning the electron beam in the image probe forming systems. This accomplishes wide field STEM-EELS.
Pico Stage Drive
The JEM-F200 uses a pico stage drive, which is capable of driving the stage in 200 pico meter step without a piezo drive, and moving the view area with a wide dynamic range from an entire sample grid to atomic order images.
SPECPORTER (auto holder loading/unloading device)
Loading/unloading of a specimen holder has been considered to bring a human error of operation, especially for the beginners.
The JEM-F200 incorporates a new device, SPECPORTER, to facilitate loading and unloading of the specimen holder.
Placing a specimen holder at a given location, and activating the SPECPORTER by a single click insures safe loading and unloading of the holder.
Improved cold FEG
The JEM-F200 supports an optional cold field emission electron gun.
Guaranteeing high stability, high brightness, and high energy resolution, the cold field emission electron gun enables chemical bonding analysis by EELS, and accelerates the analytical process owe to the high brightness electron beam, and by minimizes chromatic aberrations originated from the electron source energy spread enables higher resolution imaging.
The JEM-F200 simultaneously supports two units of an optional high sensitivity large silicon drift detectors (SDD).
The SDD, featuring enhanced sensitivity, enables speedy EDS analysis while minimizing sample damage.
The JEM-F200 incorporates an energy saving system, the ECO mode, as standard for the first time in any transmission electron microscope. The ECO mode is designed to maintain the optimum conditions of the microscope at a minimum level of energy consumption rate when it is not in operation.
The ECO mode can reduce the energy consumption rate to be approximately 1/5 of that for the normal operation mode.
Its scheduling function can restore the working conditions at anytime specified by users.
|Specification||Ultra high resolution||High resolution|
|TEM(point resolution)||0.19nm||0.23 nm|
|STEM-HAADF mode||0.14 nm (with Cold FEG)
0.16 nm (with Schottky FEG）
|0.16 nm (with Cold FEG)
0.16 nm (with Schottky FEG）
|Accelerating Voltage||200 , 80 kV|
|Major installable Options||EDS
TEM/STEM Tomography System