- Scanning Electron Microscope (SEM)
- JSM-IT200 InTouchScope™ Scanning Electron Microscope
JSM-IT200 InTouchScope™ Scanning Electron Microscope
- Related Products
JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScopeTM, with significantly higher throughput.
Specimen Exchange Navi, a beginner-friendly function, offers guided operation from sample loading to area search, and SEM image observation. “Zeromag” for seamless transition from optical to SEM imaging, “Live Analysis”*2 for real time display of elemental analysis results, SMILE VIEW（TM） Lab for seamless report generation of observation and/or analysis results, etc., provide fast analysis with integrated transition from OM to SEM.
Fast observation, analysis and report generation!
JEOL InTouchScope™ series, the high performance analytical tool with major three functions.
Specimen Exchange Navi: Guided operation from sample introduction to observation
A step-by-step guide to sample exchange, condition setting and automatic imaging.
Fast observation! "Zeromag"
You can locate the specimen area or specify analysis positions with Holder Graphics or Optical CCD image*１ displayed on the Main screen.
Fast analysis! "Live Analysis"*2
The characteristic X-ray spectrum from the measurement area and the main constituent elements are displayed during observation.
SEM observation screen
Fast report generation! SMILE VIEW™ Lab: integrated data management
Single-click of the data management button displays the Data management screen, allowing you to generate a report of all images and analysis data, as well as review or re-analyze already-acquired data.
*1 To take a CCD image, optional SNS (stage navigation system) is required.
*2 Applicable to LA （Low Vacuum & Analysis） versions.