Scanning Electron Microscope
Field Emission Scanning Electron Microscope
Electron Beam Metal AM Machine
High Performance Gas Chromatograph
- Time-of-Flight Mass Spectrometer
"CRYO ARM™ 300 II"
Field Emission Cryo-Electron Microscope
- 2020/03/31 Magnet maintenance advice in the wake of COVID-19 restrictions.
- 2017/05/30 JEOL Ltd. express ourselves that we as JEOL Ltd. and any of our affiliates have concluded no agency relationship and no contractual relationship with Ervin Danesh Aryan Company in Islamic Republic of Iran on our manufactures and sell, services and any others in all cases in the past and current business.
Seminar / Webinar