Glossary of TEM Terms

Supervised by

Michiyoshi Tanaka
Professor Emeritus at Tohoku University

Created by

JEOL Ltd.

Preface

"Glossary of TEM Terms" aims to assist understanding of the basic technical terms of Microscopy, Diffractometry and Spectroscopy of the transmission electron microscope (TEM) field. The glossary contains approximately 800 terms, which have been selected from theoretical, instrumental, crystallographic terms, specimen preparation, image processing, etc., in consideration of recent developments in the TEM field. We have strived for clear and unambiguous descriptions with an easy-to-understand manner using illustrations, TEM images and various spectral data. For the terms that are used also in other scientific fields, we focus the explanations in conformity with TEM. For highly specialized terms, we are very grateful to the professional experts for their cooperation in writing manuscripts, proofreading and data providing.
For further comprehension, references to textbooks or corresponding literatures are recommended. We continue our efforts in enlargement and improvement of the Glossary by adding new terms and enrichment of illustrations, TEM images and spectral data.
We hope that this Glossary of TEM Terms would help better understanding of TEM techniques and its effective use for TEM users.

Acknowledgments

Masami Terauchi (Professor of IMRAM, Tohoku University), Kenji Tsuda (Professor of Frontier Research Institute for Interdisciplinary Sciences, Tohoku University), Koh Saitoh (Professor of Department of Crystalline Materials Science, Graduate school of Engineering, Nagoya University) and Staff of Technical Development Department, EM Business Unit at JEOL Ltd. Many other scientists and engineers are also acknowledged.

Note: The affiliations of people who kindly provided data are at the time when the data were provided.

Terms are added or updated

  • October 29, 2019
    update Fourier transform
  • October 29, 2019
    update inverse Fourier transform
  • October 09, 2019
    update scanning transmission electron microscope (STEM) image
  • October 09, 2019
    update dark-field image
  • October 09, 2019
    update bright-field image
  • June 10, 2019
    update surface plasmon
  • June 10, 2019
    update Autoradiography (Autoradiography in Electron Microscopy)
  • June 10, 2019
    update Reliability factor, R-factor
  • April 18, 2019
    update Born approximation
  • April 18, 2019
    update Young fringe