CONTACT
REGIONAL SITE
NEWS LETTER
Select Regional Site
Global Site
Americas
Asia
Australia
Belgium
China
France
Germany
Italy
India
Japan
Korea
Malaysia
Mexico
Middle East
Sweden
The Netherlands
U.K.
PRODUCTS
APPLICATIONS NOTES
SUPPORT
ABOUT US
PRODUCTS
Transmission Electron Microscopes
Transmission Electron Microscope (TEM)
Scanning Electron Microscopes
Scanning Electron Microscope (SEM)
Ion Beam Application Equipment
Specimen Preparation Equipment
MultiBeam System (SEM-FIB)
Instruments for Microarea and Surface Analysis
Electron Probe Microanalyzer (EPMA)
Auger Microprobe (Auger)
Photoelectron Spectrometer (ESCA)
Magnetic Resonance Equipment
Nuclear Magnetic Resonance
Spectrometer (NMR)
Electron Spin Resonance
Spectrometer (ESR)
X-ray Fluorescence Spectrometers
X-ray Fluorescence Spectrometer (XRF)
Mass Spectrometers (MS)
GC-MS、Gas Analysis MS
LC-MS(DART™-MS)、MALDI-TOFMS
Software
Semiconductor Equipment
Electron Beam Lithography System (EB)
3D Printer
Electron Beam Metal AM Machine
Industrial Equipment for thin-film formation and material processing
Thin Film Formation Equipment
(E-Beam and Plasma Sources, etc.)
Material Processing Equipment
(For Metal Melting and Nanopowder Synthesis, etc.)
Clinical Chemistry Analyzers
Clinical Chemistry Analyzer (CA)
APPLICATIONS NOTES
Basic Research
Chemistry
Automobile
Chemicals
Glass, Ceramics, Cement
Education
Battery, Energy
Semiconductor and Electronic Parts
Rubber, Plastic
Medicine, Life
Environment, Asbestos
Food
Metal
About Us
About Us
Social Activities
Initiatives for the SDGs
Environment Activities
Open Innovation
News
Investor Relations
Event / Exhibition
PRODUCTS
Transmission Electron Microscopes
Transmission Electron Microscope (TEM)
Magnetic Resonance Equipment
Nuclear Magnetic Resonance
Spectrometer (NMR)
Electron Spin Resonance
Spectrometer (ESR)
Semiconductor Equipment
Electron Beam Lithography System (EB)
Scanning Electron Microscopes
Scanning Electron Microscope (SEM)
3D Printer
Electron Beam Metal AM Machine
Ion Beam Application Equipment
Specimen Preparation Equipment
MultiBeam System (SEM-FIB)
X-ray Fluorescence Spectrometers
X-ray Fluorescence Spectrometer (XRF)
Industrial Equipment for thin-film
formation and material processing
Thin Film Formation Equipment
(E-Beam and Plasma Sources, etc.)
Material Processing Equipment
(For Metal Melting and Nanopowder Synthesis, etc.)
Instruments for Microarea and
Surface Analysis
Electron Probe Microanalyzer (EPMA)
Auger Microprobe (Auger)
Photoelectron Spectrometer (ESCA)
Mass Spectrometers
GC-MS、Gas Analysis MS
LC-MS(DART-MS)、MALDI-TOFMS
Software
Clinical Chemistry Analyzers
Clinical Chemistry Analyzer (CA)
APPLICATIONS NOTES
Basic Research
Education
Medicine, Life
Chemistry
Battery, Energy
Environment, Asbestos
Automobile
Semiconductor And Electronic Parts
Food
Chemicals
Rubber, Plastic
Glass, Ceramics, Cement
Metal
Search By Product Group
SUPPORT
ABOUT US
About Us
Environment Activities
Investor Relations
Social Activities
Open Innovation
Initiatives for the SDGs
Event / Exhibition
News
TOP
Glossary of SEM Terms
An Initial "
Q
"
An Initial "
Q
"
results found.
KEYWORD / INITIAL SEARCH
from Keywords
Enter keyword
Search
from An Initial
A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Z
0-9/Sign
