JEOL NEWS Vol.53
JEOL NEWS Vol.53/ July 2018
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Applications
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Fast Pixelated Detectors: A New Era for STEM
Peter D Nellist and Gerardo T Martinez
Department of Materials, University of Oxford -
Y. Eren Suyolcu, Yi Wang, Federico Baiutti, Wilfried Sigle, Georg Cristiani, Giuliano Gregori, Gennady Logvenov, Joachim Maier, Peter A. van Aken
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research -
Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
Keiichi Namba and Takayuki Kato
Graduate School of Frontier Biosciences, Osaka University -
Electronic State Analysis by Monochromated STEM-EELS
Hiroki Kurata
Institute for Chemical Research, Kyoto University -
Chemical State Analyses by Soft X-ray Emission Spectroscopy
Masami Terauchi and Yohei Sato
Center for Advanced Microscopy and Spectroscopy, Institute of Multidisciplinary Research for Advanced Materials, Tohoku University -
X-ray, Electron and NMR Crystallography to Structural Determination of Small Organic Molecules
Yusuke Nishiyama1, 2
1JEOL RESONANCE Inc. 2RIKEN CLST-JEOL Collaboration Center -
Structural Analysis of Semiconductor Devices by Using STEM/EDS Tomography
Yoshitaka Aoyama1, Ichiro Ohnishi1, Noriaki Endo1, Eiji Okunishi1, Takeo Sasaki2, Yorinobu Iwasawa3, Yukihito Kondo1
1EM Business Unit, JEOL Ltd. 2JEOL (U.K.) LTD. 3EC Business Unit, JEOL Ltd. -
Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials
Tomohiro Haruta
Application Management Department, JEOL Ltd. -
Masaaki Ubukata and Yoshihisa Ueda
MS Business Unit, JEOL Ltd. -
Development of the JBX-8100FS Electron Beam Lithography System
Yukinori Aida
SE Business Unit, JEOL Ltd.