X線発光分光

X-ray emission spectroscopy, XES

[目次：分光分析(EELS／EDS／電子構造)]

物質にX線、電子線などを照射し、放出されたX線を分光分析して固体の電子の占有状態(価電子帯)の状態密度を測る手法。

A spectroscopy method, which measures the density of states of the occupied states (valence band) by analyzing X-rays emitted from a substance illuminated with an X-ray beam or an electron beam.

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