透過電子顕微鏡像

transmission electron microscope (TEM) image

[目次：理論(電子の散乱／回折／結像)]

試料を透過してくる電子(透過電子)で結像する像。中低倍率で組織観察するときの明視野、暗視野像と高倍率で原子レベルの構造を観察する結晶構造像がある。これらの像は弾性散乱電子で作られる。試料が厚くなると(～10nm以上)非弾性散乱電子が重畳しこれらの像が不明瞭になる。非弾性散乱電子をエネルギーフィルタで取り除くと明瞭な像が得られる。

An image formed by electrons transmitted through a specimen (transmitted electrons). The TEM image is classified into two kinds: The bright-field image and the dark-field image used for tissue observation at low-to-medium magnifications, and the structure image for atomic-scale structure observation at high magnifications. These images are produced by elastically scattered electrons. As a specimen is thicker (～10 nm or thicker), inelastically scattered electrons are superposed on elastically scattered electrons, thus obscuring these images. When inelastically scattered electrons are removed with an energy filter, a clear image is obtained.

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